Thermal Testing of Integrated Circuits
Language: English
Published by Springer, 2002
- Hardcover
- Used
Seller: Mispah books, Redhill, Surrey, United KingdomMispah books
AbeBooks seller since April 15, 2021
Condition: Used - As new
US$ 175.40
Quantity: 1 available
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Seller Inventory # ERICA75814020707645
- Title
- Thermal Testing of Integrated Circuits
- Author
- Altet, J., Rubio, Antonio
- Publisher
- Springer
- Publication year
- 2002
- Condition
- Like New
- Book Type
- book
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 1402070764
- ISBN 13
- 9781402070761
Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.
"Synopsis" may belong to another edition of this title.
Mispah books
Redhill, Surrey, United Kingdom
AbeBooks seller since April 15, 2021
Shipping rates from United Kingdom to U.S.A.
| Item | 14 to 15 business days | 9 to 10 business days |
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| First item | US$ 33.52 | US$ 36.20 |
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We have collection of General books ,Science Books, Fiction & Academic Books. we ship from multiple location. Delhi, US and UK Return Address Mispah books 1A Beechwood Villas, Salford Redhill , Surrey RH1 5EY United Kingdom
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Mispah books
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