Thermal Testing of Integrated Circuits
Language: English
Published by Springer, 2002
- Hardcover
- New
Seller: California Books, Miami, FL, U.S.A.California Books
AbeBooks seller since October 27, 2023
Condition: New
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Add to basketSeller Inventory # I-9781402070761
- Title
- Thermal Testing of Integrated Circuits
- Author
- Altet, J.; Rubio, Antonio
- Publisher
- Springer
- Publication year
- 2002
- Condition
- New
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 1402070764
- ISBN 13
- 9781402070761
Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.
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