Thermal Testing of Integrated Circuits
Language: English
Published by Springer, 2002
- Hardcover
- Used
Seller: Books From California, Simi Valley, CA, U.S.A.Books From California
AbeBooks seller since August 14, 2001
Condition: Used - Very good
US$ 65.23
Quantity: 1 available
Add to basketSeller Inventory # mon0004278547
- Title
- Thermal Testing of Integrated Circuits
- Author
- Rubio, Antonio,Altet, J.
- Publisher
- Springer
- Publication year
- 2002
- Condition
- Very Good
- Binding
- hardcover
- Language
- English
- ISBN 10
- 1402070764
- ISBN 13
- 9781402070761
Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.
"Synopsis" may belong to another edition of this title.
Books From California
Simi Valley, CA, U.S.A.
AbeBooks seller since August 14, 2001
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