Tutorial: Test Generation for Vlsi Chips
Language: English
Published by IEEE Computer Society Press,U.S., 1988
- Hardcover
- Used

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400 Seiten Ausgetragenes Bibliotheksexemplar, Einband leicht berieben, Papier in altersgemäßem sehr gutem Zustand. B02-03-01F Sprache: Englisch Gewicht in Gramm: 1305.
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- Title
- Tutorial: Test Generation for Vlsi Chips
- Author
- Agrawal, Vishwani D. and Sharad C. Seth:
- Publisher
- IEEE Computer Society Press,U.S.
- Publication year
- 1988
- Condition
- Sehr gut
- Binding
- 4°, Gebundene Ausgabe
- Language
- English
- ISBN 10
- 081868786X
- ISBN 13
- 9780818687860
- Item weight
- 1,305 grams
- Seller catalogs
- Elektronik
Reprints of papers taken from 18 different journals, published between 1967 and 1987. They give a comprehensive overview of very large-scale integration testing. No significant prior experience in testing is assumed. Concepts and current practices are emphasized. Chapters are preceded by a tutorial. Graphs and illustrations are featured in most pages. Topics include fault modeling, test generation, test evaluation, testability analysis, design for testability, and automatic test equipment. Annotation copyright Book News, Inc. Portland, Or.
"Synopsis" may belong to another edition of this title.
avelibro OHG
Dinkelscherben, Germany
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