VLSI-SoC: From Algorithms to Circuits and System-on-Chip Design

Andreas Burg

ISBN 10: 3642450725 / ISBN 13: 9783642450723

Published by Springer Berlin Heidelberg Nov 2013, 2013

About this Item

This item is printed on demand - it takes 3-4 days longer - Neuware -This book contains extended and revised versions of the best papers presented at the 20th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2012, held in Santa Cruz, CA, USA, in October 2012. The 12 papers included in the book were carefully reviewed and selected from the 33 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of these systems. 248 pp. Englisch.

Seller Inventory # 9783642450723

Bibliographic Details

• Title: VLSI-SoC: From Algorithms to Circuits and System-on-Chip Design
• Publisher: Springer Berlin Heidelberg Nov 2013
• Publication Date: 2013
• Language: English
• ISBN 10: 3642450725
• ISBN 13: 9783642450723
• Binding: Buch
• Condition: Neu
• Dimensions: 241W x 160H x 20D millimeters 241 millimeters width by 160 millimeters height by 20 millimeters depth
• Weight: 541 grams

About this title

Synopsis

This book contains extended and revised versions of the best papers presented at the 20th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2012, held in Santa Cruz, CA, USA, in October 2012. The 12 papers included in the book were carefully reviewed and selected from the 33 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of these systems.