VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon)
Wen, Xiaoqing,Wu, Cheng-Wen,Wang, Laung-Terng
ISBN 10:
0123705975 ISBN 13:
9780123705976
Published by Morgan Kaufmann, 2006
Language: English
Condition: Used - Fair
Hardcover
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