VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))

Wang, Laung-Terng; Wu, Cheng-Wen; Wen, Xiaoqing

ISBN 10: 0123705975 / ISBN 13: 9780123705976

Published by Morgan Kaufmann, 2006

About this Item

hardcover. Page block firm and clean, binding unblemished, boards straight, without markings of any kind. Supporting Bay Area Friends of the Library since 2010. Well packaged and promptly shipped.

Seller Inventory # BAY10-00106

Bibliographic Details

• Title: VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
• Publisher: Morgan Kaufmann
• Publication Date: 2006
• Language: English
• ISBN 10: 0123705975
• ISBN 13: 9780123705976
• Binding: Hardcover
• Condition: Like New

About this title

Synopsis

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

• Most up-to-date coverage of design for testability.
• Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
• Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

About the Authors

Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007).

Kwang-Ting (Tim) Cheng, Ph.D., is a Professor and Chair of the Electrical and Computer Engineering Department at the University of California, Berkeley. A Fellow of the IEEE, he has published over 300 technical papers, co-authored three books, and holds 11 U.S. Patents.