X-ray Diffraction at Elevated Temperatures: A Method for In Situ Process Analysis.

Chung, Deborah D. L. et. al.:

ISBN 10: 3527278427 ISBN 13: 9783527278428
Published by New York, NY: VCH., 1993
Language: English
Condition: Used - Fine Hardcover

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Used - Hardcover

Condition: Used - Fine

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