Baptiste Gault (28 results)

Vie de Nicolas Poussin, considéré comme chef de l'École françoise -Language: french
Gault De Saint-Germain, Pierre-Marie; Massard, Jean; Massard, Jean Baptiste Louis
- Softcover
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Vie de Nicolas Poussin, considéré comme chef de l'École françoise: précédé d'un Précis historique des peintres françois, suivie de notes inédites et authentiques (French Edition)
Gault De Saint-Germain, Pierre-Marie; Massard, Jean; Massard, Jean Baptiste Louis
- Softcover
Seller: California Books, Miami, FL, U.S.A.California Books
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Vie de Nicolas Poussin, considéré comme chef de l'École françoise -Language: french
Gault De Saint-Germain, Pierre-Marie; Massard, Jean; Massard, Jean Baptiste Louis
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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Vie de Nicolas Poussin, considéré comme chef de l'École françoise -Language: french
Gault De Saint-Germain, Pierre-Marie; Massard, Jean; Massard, Jean Baptiste Louis
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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Vie de Nicolas Poussin, considéré comme chef de l'École françoise (French Edition)
Gault De Saint-Germain, Pierre-Marie; Massard, Jean; Massard, Jean Baptiste Louis
- Softcover
Seller: California Books, Miami, FL, U.S.A.California Books
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Vie de Nicolas Poussin, considéré comme chef de l'École françoise -Language: french
Gault De Saint-Germain, Pierre-Marie; Massard, Jean; Massard, Jean Baptiste Louis
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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Vie de Nicolas Poussin, considéré comme chef de l'École françoise: précédé d'un Précis historique des peintres françois, suivie de notes inédites et authentiques (French Edition)
Gault De Saint-Germain, Pierre-Marie; Massard, Jean; Massard, Jean Baptiste Louis
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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Vie de Nicolas Poussin, considéré comme chef de l'École françoise -Language: french
Gault De Saint-Germain, Pierre-Marie; Massard, Jean; Massard, Jean Baptiste Louis
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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Vie de Nicolas Poussin, considéré comme chef de l'École françoise (French Edition)
Gault De Saint-Germain, Pierre-Marie; Massard, Jean; Massard, Jean Baptiste Louis
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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Vie de Nicolas Poussin, considéré comme chef de l'École françoise -Language: french
Gault De Saint-Germain, Pierre-Marie; Massard, Jean; Massard, Jean Baptiste Louis
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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Vie de Nicolas Poussin, considéré comme chef de l'École françoise -Language: french
Gault De Saint-Germain, Pierre-Marie; Massard, Jean; Massard, Jean Baptiste Louis
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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Vie de Nicolas Poussin, considéré comme chef de l'École françoise -Language: french
Gault De Saint-Germain, Pierre-Marie; Massard, Jean; Massard, Jean Baptiste Louis
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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Vie de Nicolas Poussin, Considéré Comme Chef de l École Françoise: Précédé d Un Précis Historique Des Peintres François, Suivie de Notes Inédites Et A
Gault de Saint-Germain, Pierre-Marie|Massard, Jean|Massard, Jean Baptiste Louis
- Softcover
Seller: moluna, Greven, Germanymoluna
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Vie de Nicolas Poussin, Considere Comme Chef de l\ Ecole Francoise
Gault de Saint-Germain, Pierre-Marie|Massard, Jean|Massard, Jean Baptiste Louis
- Softcover
Seller: moluna, Greven, Germanymoluna
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Atom Probe Microscopy (Springer Series in Materials Science, 160)
Gault, Baptiste; Moody, Michael P.; Cairney, Julie M.; Ringer, Simon P.
Language: English
Published by Springer, 2014
Series: Book 39 of 233 - Springer Series in Materials Science
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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Atom Probe Microscopy (Springer Series in Materials Science (160))
Gault, Baptiste; Moody, Michael P.; Cairney, Julie M.; Ringer, Simon P.
Language: English
Published by Springer, 2012
Series: Book 39 of 233 - Springer Series in Materials Science
- Hardcover
Seller: Greenway, Chattanooga, TN, U.S.A.Greenway
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Hardcover. Condition: Good condition. good condition,fast ship.

Language: English
Published by Springer New York, 2014
Series: Book 39 of 233 - Springer Series in Materials Science
- Softcover
Seller: moluna, Greven, Germanymoluna
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Language: English
Published by Springer New York, 2012
Series: Book 39 of 233 - Springer Series in Materials Science
- Hardcover
Seller: moluna, Greven, Germanymoluna
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Gebunden. Condition: New.

Atom Probe Microscopy (Springer Series in Materials Science, 160)
Gault, Baptiste; Moody, Michael P.; Cairney, Julie M.; Ringer, Simon P.
Language: English
Published by Springer, 2014
Series: Book 39 of 233 - Springer Series in Materials Science
- Softcover
Seller: California Books, Miami, FL, U.S.A.California Books
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Language: English
Published by Springer, Humana, 2014
Series: Book 39 of 233 - Springer Series in Materials Science
- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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US$ 369.75
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the…development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument's capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy-including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.

Language: English
Published by Springer, Humana, 2012
Series: Book 39 of 233 - Springer Series in Materials Science
- Hardcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
Contact seller5-star sellerCondition: New
US$ 369.75
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the develop…ment of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument's capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy-including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.

- Softcover
Seller: liu xing, Nanjing, JS, Chinaliu xing
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paperback. Condition: New. Paperback. Pub Date: 2016-03-01 Pages: 326 Language: Chinese Publisher: science press co. LTD. the atom probe microscopy includes theoretical basis. practical aspects of atom probe and its application in material science three parts. first summarizes the development course of atom probe technology. int…roduces the prototype of atom probe field from.

Language: English
Published by Springer, 2012
Series: Book 39 of 233 - Springer Series in Materials Science
- Hardcover
- Print on Demand
Seller: Brook Bookstore On Demand, Napoli, NA, ItalyBrook Bookstore On Demand
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US$ 274.62
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Condition: new. Questo è un articolo print on demand.

Language: English
Published by Springer, 2014
Series: Book 39 of 233 - Springer Series in Materials Science
- Softcover
- Print on Demand
Seller: Brook Bookstore On Demand, Napoli, NA, ItalyBrook Bookstore On Demand
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Condition: new. Questo è un articolo print on demand.

Language: English
Published by Springer, Humana Jun 2014, 2014
Series: Book 39 of 233 - Springer Series in Materials Science
- Softcover
- Print on Demand
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.
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US$ 357.21
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last…decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument's capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy-including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes. 420 pp. Englisch.

Language: English
Published by Springer, Humana Mai 2012, 2012
Series: Book 39 of 233 - Springer Series in Materials Science
- Hardcover
- Print on Demand
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.
Contact seller5-star sellerCondition: New
US$ 357.21
US$ 26.62 shippingShips from Germany to U.S.A.Quantity: 2 available
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade…with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument's capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy-including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes. 420 pp. Englisch.

Language: English
Published by Springer, Humana Mai 2012, 2012
Series: Book 39 of 233 - Springer Series in Materials Science
- Hardcover
- Print on Demand
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000
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Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with… the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument¿s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy¿including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 420 pp. Englisch.

Language: English
Published by Springer, Humana Jun 2014, 2014
Series: Book 39 of 233 - Springer Series in Materials Science
- Softcover
- Print on Demand
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000
Contact seller5-star sellerCondition: New
US$ 357.21
US$ 69.46 shippingShips from Germany to U.S.A.Quantity: 1 available
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last deca…de with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument¿s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy¿including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 420 pp. Englisch.