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Behnam Ghavami (44 results)
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Condition: As New. Unread book in perfect condition.
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Condition: As New. Unread book in perfect condition.
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Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
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Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques
Seller: Ria Christie Collections, Uxbridge, United Kingdom
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Soft Error Reliability of Vlsi Circuits : Analysis and Mitigation Techniques
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Condition: New. 1st ed. 2021 edition NO-PA16APR2015-KAP.
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Soft Error Reliability of Vlsi Circuits : Analysis and Mitigation Techniques
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Add to basketHardcover. Condition: Brand New. 127 pages. 9.25x6.10x9.21 inches. In Stock.
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Lifetime Reliability-aware Design of Integrated Circuits
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Lifetime Reliability-aware Design of Integrated Circuits
Seller: Ria Christie Collections, Uxbridge, United Kingdom
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Lifetime Reliability-Aware Design of Integrated Circuits
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Condition: New.
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Condition: New.
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Lifetime Reliability-Aware Design of Integrated Circuits
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Taschenbuch. Condition: Neu. Soft Error Reliability of VLSI Circuits | Analysis and Mitigation Techniques | Behnam Ghavami (u. a.) | Taschenbuch | xiii | Englisch | 2021 | Springer | EAN 9783030516123 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Condition: New.
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Condition: New. pp. 124.
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Add to basketPaperback. Condition: Brand New. 120 pages. 9.25x6.10x0.28 inches. In Stock.
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Add to basketHardcover. Condition: Brand New. 120 pages. 9.25x6.10x9.21 inches. In Stock.
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Lifetime Reliability-aware Design of Integrated Circuits
Language: English
Published by Springer International Publishing, 2023
ISBN 10: 3031153472 ISBN 13: 9783031153471
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.
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Lifetime Reliability-aware Design of Integrated Circuits
Language: English
Published by Springer International Publishing, 2022
ISBN 10: 3031153448 ISBN 13: 9783031153440
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.
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Condition: Hervorragend. Zustand: Hervorragend | Sprache: Englisch | Produktart: Bücher | This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.
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Lifetime Reliability-aware Design of Integrated Circuits Behnam Ghavami
Seller: BUCHSERVICE / ANTIQUARIAT Lars Lutzer, Wahlstedt, Germany
Seller rating 5 out of 5 stars
Hardcover. Condition: gut. 2022. Lifetime Reliability-aware Design of Integrated Circuits In deutscher Sprache. pages.
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Condition: new. Questo è un articolo print on demand.
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Condition: new. Questo è un articolo print on demand.
