Boon K Teo (12 results)
- Hardcover
Seller: Anybook.com, Lincoln, United KingdomAnybook.com
Contact seller5-star sellerCondition: Used - Poor
US$ 35.94
US$ 18.38 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Condition: Poor. Volume 9. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In poor condition, suitable as a reading copy. No dust jacket. Library sticker on front cover. Please note the Image in this listing is a stock photo and may not match the covers of the ac…tual item,800grams, ISBN:3540158332.
- Softcover
Seller: Basi6 International, Irving, TX, U.S.A.Basi6 International
Contact seller5-star sellerCondition: New
US$ 67.97
Free ShippingShips within U.S.A.Quantity: 10 available
Condition: Brand New. New. Delivery takes 25-30 days. Excellent Customer Service.
- Softcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
Contact seller4-star sellerCondition: New
US$ 90.43
US$ 3.99 shippingShips within U.S.A.Quantity: 4 available
Condition: New. pp. xviii + 349.
- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
Contact seller5-star sellerCondition: New
US$ 98.54
US$ 16.89 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Paperback. Condition: Brand New. 1986 edition. 349 pages. 9.50x6.10x0.90 inches. In Stock.
- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
Contact seller5-star sellerCondition: New
US$ 63.61
US$ 72.65 shippingShips from Germany to U.S.A.Quantity: 1 available
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The phenomenon of Extended X-Ray Absorption Fine Structure (EXAFS) has been known for some time and was first treated theoretically by Kronig in the 1930s. Recent developments, initiated by Sayers, Stern, and Lytle in the early 1970s, have led to t…he recognition of the structural content of this technique. At the same time, the availability of synchrotron radiation has greatly improved both the acquisition and the quality of the EXAFS data over those obtainable from conventional X-ray sources. Such developments have established EXAFS as a powerful tool for structure studies. EXAFS has been successfully applied to a wide range of significant scientific and technological systems in many diverse fields such as inorganic chemistry, biochemistry, catalysis, material sciences, etc. It is extremely useful for systems where single-crystal diffraction techniques are not readily applicable (e.g., gas, liquid, solution, amorphous and polycrystalline solids, surfaces, polymer, etc.). Despite the fact that the EXAFS technique and applications have matured tremendously over the past decade or so, no introductory textbook exists. EXAFS: Basic Principles and Data Analysis represents my modest attempt to fill such a gap. In this book, I aim to introduce the subject matter to the novice and to help alleviate the confusion in EXAFS data analysis, which, although becoming more and more routine, is still a rather tricky endeavor and may, at times, discourage the beginners.
- Softcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
Contact seller4-star sellerCondition: Used - As new
US$ 134.99
US$ 33.78 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
- Softcover
- Print on Demand
Seller: Brook Bookstore On Demand, Napoli, NA, ItalyBrook Bookstore On Demand
Contact seller5-star sellerCondition: New
US$ 54.97
US$ 7.85 shippingShips from Italy to U.S.A.Quantity: Over 20 available
Condition: new. Questo è un articolo print on demand.
Language: English
Published by Springer Berlin Heidelberg, Springer Apr 2014, 2014
- Softcover
- Print on Demand
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.
Contact seller5-star sellerCondition: New
US$ 63.61
US$ 26.56 shippingShips from Germany to U.S.A.Quantity: 2 available
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The phenomenon of Extended X-Ray Absorption Fine Structure (EXAFS) has been known for some time and was first treated theoretically by Kronig in the 1930s. Recent developments, initiated by Sayers, Stern, and Lytle in the early 1970…s, have led to the recognition of the structural content of this technique. At the same time, the availability of synchrotron radiation has greatly improved both the acquisition and the quality of the EXAFS data over those obtainable from conventional X-ray sources. Such developments have established EXAFS as a powerful tool for structure studies. EXAFS has been successfully applied to a wide range of significant scientific and technological systems in many diverse fields such as inorganic chemistry, biochemistry, catalysis, material sciences, etc. It is extremely useful for systems where single-crystal diffraction techniques are not readily applicable (e.g., gas, liquid, solution, amorphous and polycrystalline solids, surfaces, polymer, etc.). Despite the fact that the EXAFS technique and applications have matured tremendously over the past decade or so, no introductory textbook exists. EXAFS: Basic Principles and Data Analysis represents my modest attempt to fill such a gap. In this book, I aim to introduce the subject matter to the novice and to help alleviate the confusion in EXAFS data analysis, which, although becoming more and more routine, is still a rather tricky endeavor and may, at times, discourage the beginners. 368 pp. Englisch.
- Softcover
- Print on Demand
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
Contact seller4-star sellerCondition: New
US$ 88.56
US$ 8.78 shippingShips from United Kingdom to U.S.A.Quantity: 4 available
Condition: New. Print on Demand pp. xviii + 349.
- Softcover
- Print on Demand
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
Contact seller4-star sellerCondition: New
US$ 95.85
US$ 11.49 shippingShips from Germany to U.S.A.Quantity: 4 available
Condition: New. PRINT ON DEMAND pp. xviii + 349.
Language: English
Published by Springer Berlin Heidelberg, Springer Berlin Heidelberg Apr 2014, 2014
- Softcover
- Print on Demand
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000
Contact seller5-star sellerCondition: New
US$ 63.61
US$ 69.28 shippingShips from Germany to U.S.A.Quantity: 1 available
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The phenomenon of Extended X-Ray Absorption Fine Structure (EXAFS) has been known for some time and was first treated theoretically by Kronig in the 1930s. Recent developments, initiated by Sayers, Stern, and Lytle in the early 1970s, h…ave led to the recognition of the structural content of this technique. At the same time, the availability of synchrotron radiation has greatly improved both the acquisition and the quality of the EXAFS data over those obtainable from conventional X-ray sources. Such developments have established EXAFS as a powerful tool for structure studies. EXAFS has been successfully applied to a wide range of significant scientific and technological systems in many diverse fields such as inorganic chemistry, biochemistry, catalysis, material sciences, etc. It is extremely useful for systems where single-crystal diffraction techniques are not readily applicable (e.g., gas, liquid, solution, amorphous and polycrystalline solids, surfaces, polymer, etc.). Despite the fact that the EXAFS technique and applications have matured tremendously over the past decade or so, no introductory textbook exists. EXAFS: Basic Principles and Data Analysis represents my modest attempt to fill such a gap. In this book, I aim to introduce the subject matter to the novice and to help alleviate the confusion in EXAFS data analysis, which, although becoming more and more routine, is still a rather tricky endeavor and may, at times, discourage the beginners.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 368 pp. Englisch.
- Softcover
- Print on Demand
Seller: preigu, Osnabrück, Germanypreigu
Contact seller5-star sellerCondition: New
US$ 58.33
US$ 80.83 shippingShips from Germany to U.S.A.Quantity: 5 available
Taschenbuch. Condition: Neu. EXAFS: Basic Principles and Data Analysis | Boon K. Teo | Taschenbuch | xviii | Englisch | 2014 | Springer-Verlag GmbH | EAN 9783642500336 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print…on Demand.
