Breitenstein Otwin (19 results)
Language: English
Published by Springer, 2010
Series: Springer Series in Advanced Microelectronics, Book 29 of 72. Book 29 of 72 - Springer Series in Advanced Microelectronics
- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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Language: English
Published by Springer, 2019
Series: Springer Series in Advanced Microelectronics, Book 63 of 72. Book 63 of 72 - Springer Series in Advanced Microelectronics
- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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Language: English
Published by Springer, Berlin, Springer Berlin Heidelberg, Springer, 2010
Series: Springer Series in Advanced Microelectronics, Book 29 of 72. Book 29 of 72 - Springer Series in Advanced Microelectronics
- Hardcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - In the last 7 years, the rst edition of 'Lock-in Thermography' has established as a reference book for all users of this technique for investigating electronic devices, especially solar cells. At this time, a vital further development of lock-in therm- ra…phy could be observed. Not only the experimental technique was improved by applying new and better infrared cameras, solid immersion lenses, and novel t- ing strategies, but also completely new application elds of lock-in thermography were established by implying irradiation of light during the measurements. The two groups of new techniques are different kinds of Illuminated Lock-In Thermography (ILIT) and Carrier Density Imaging, resp. Infrared Lifetime Imaging (CDI/ILM). While ILIT is performed on solar cells, CDI/ILM is performed on bare wafers for imaging the local minority carrier lifetime and the local concentration of trapping centers. The new edition of this book implements these new developments. One new section entitled 'Timing strategies' is added. In this, new ways are introduced to overcome previous limitations of the choice of the lock-in frequency in comparison with the frame rate of the camera. The previous diffraction limit of the spatial resolution can be overcome by a factor of up to 4 by applying so-called solid immersion lenses. This technique is introduced and its application for failure analysis of ICs, where highest possible spatial resolution is desired, is shown in another new section.
Language: English
Published by Springer, 2019
Series: Springer Series in Advanced Microelectronics, Book 63 of 72. Book 63 of 72 - Springer Series in Advanced Microelectronics
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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Condition: New.
Language: English
Published by Springer, 2019
Series: Springer Series in Advanced Microelectronics, Book 63 of 72. Book 63 of 72 - Springer Series in Advanced Microelectronics
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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Condition: As New. Unread book in perfect condition.
Language: English
Published by Springer, 2019
Series: Springer Series in Advanced Microelectronics, Book 63 of 72. Book 63 of 72 - Springer Series in Advanced Microelectronics
- Hardcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
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Condition: New.
Language: English
Published by Springer, 2010
Series: Springer Series in Advanced Microelectronics, Book 29 of 72. Book 29 of 72 - Springer Series in Advanced Microelectronics
- Hardcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
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Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Language: English
Published by Springer Verlag, 2019
Series: Springer Series in Advanced Microelectronics, Book 63 of 72. Book 63 of 72 - Springer Series in Advanced Microelectronics
- Hardcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
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Hardcover. Condition: Brand New. 3rd edition. 344 pages. 9.25x6.10x1.18 inches. In Stock.
- Hardcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
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Hardcover. Condition: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
- Hardcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
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Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Language: English
Published by Springer Berlin Heidelberg, 2010
Series: Springer Series in Advanced Microelectronics, Book 29 of 72. Book 29 of 72 - Springer Series in Advanced Microelectronics
- Hardcover
- Print on Demand
Seller: PBShop.store US, Wood Dale, IL, U.S.A.PBShop.store US
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HRD. Condition: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
Language: English
Published by Springer Berlin Heidelberg, 2010
Series: Springer Series in Advanced Microelectronics, Book 29 of 72. Book 29 of 72 - Springer Series in Advanced Microelectronics
- Hardcover
- Print on Demand
Seller: PBShop.store UK, Fairford, GLOS, United KingdomPBShop.store UK
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HRD. Condition: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
Language: English
Published by Springer Berlin Heidelberg Sep 2010, 2010
Series: Springer Series in Advanced Microelectronics, Book 29 of 72. Book 29 of 72 - Springer Series in Advanced Microelectronics
- Hardcover
- Print on Demand
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.
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Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-st…ate thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced. 268 pp. Englisch.
Language: English
Published by Springer, 2019
Series: Springer Series in Advanced Microelectronics, Book 63 of 72. Book 63 of 72 - Springer Series in Advanced Microelectronics
- Hardcover
- Print on Demand
Seller: Brook Bookstore On Demand, Napoli, NA, ItalyBrook Bookstore On Demand
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Condition: new. Questo è un articolo print on demand.
- Hardcover
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Seller: moluna, Greven, Germanymoluna
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Describes an imaging technique for the evaluation of materials and electronic devicesDiscusses various new application fields of lock-in thermographyIs useful as a reference work for researchers and engineer…s alikeIncludes ext.
Language: English
Published by Springer International Publishing Jan 2019, 2019
- Hardcover
- Print on Demand
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.
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Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Peri…odically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included. 344 pp. Englisch.
Language: English
Published by Springer International Publishing, Springer International Publishing Jan 2019, 2019
- Hardcover
- Print on Demand
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000
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Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodic…ally modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 344 pp. Englisch.
Language: English
Published by Springer, 2019
Series: Springer Series in Advanced Microelectronics, Book 63 of 72. Book 63 of 72 - Springer Series in Advanced Microelectronics
- Hardcover
- Print on Demand
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
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Condition: New. Print on Demand.
Language: English
Published by Springer, 2019
Series: Springer Series in Advanced Microelectronics, Book 63 of 72. Book 63 of 72 - Springer Series in Advanced Microelectronics
- Hardcover
- Print on Demand
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
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Condition: New. PRINT ON DEMAND.
