C P Neo (5 results)

Microwave Electronics: Measurement and Materials Characterization
L. F. Chen, C. K. Ong, C. P. Neo, V. V. Varadan, Vijay K. Varadan
- Hardcover
Seller: Chiron Media, Wallingford, United KingdomChiron Media
Contact seller5-star sellerCondition: New
US$ 233.92
US$ 13.39 shippingShips from United Kingdom to U.S.A.Quantity: 20 available
Hardcover. Condition: New. Brand new book, sourced directly from publisher. Dispatch time is 3-4 days from our warehouse. Book will be sent in robust, secure packaging to ensure it reaches you securely.

- Hardcover
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
Contact seller4-star sellerCondition: New
US$ 250.96
US$ 8.71 shippingShips from United Kingdom to U.S.A.Quantity: 3 available
Condition: New. pp. xiii + 537 Illus.

Microwave Electronics: Measurement and Materials Characterization
Chen, L. F.; Ong, C. K.; Neo, C. P.; Varadan, V. V.; Varadan, Vijay K.
- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
US$ 257.81
US$ 20.02 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In English.

- Hardcover
Seller: Books Puddle, Woodside, NY, U.S.A.Books Puddle
Contact seller4-star sellerCondition: New
US$ 277.85
US$ 3.99 shippingShips within U.S.A.Quantity: 3 available
Condition: New. pp. xiii + 537.

- Hardcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
Contact seller5-star sellerCondition: New
US$ 286.61
US$ 49.68 shippingShips from Germany to U.S.A.Quantity: 2 available
Buch. Condition: Neu. Neuware - The development of high speed, high frequency circuits and systems requires an understanding of the properties of materials functioning at the microwave level. This comprehensive reference sets out to address this requirement by providing guidance on the development of suitable measurement methodologies tailored for a variety of materials and application systems. Bringing together coverage of a broad range of techniques in one publication for the first time, this book:\* Provides a comprehensive introduction to microwave theory and microwave measurement techniques.\* Examines every aspect of microwave material properties, circuit design and applications.\* Presents materials property characterisation methods along with a discussion of the underlying theory.\* Outlines the importance of microwave absorbers in the reduction in noise levels in microwave circuits and their importance within defence industry applications.\* Relates each measurement technique to its application across the fields of microwave engineering, high-speed electronics, remote sensing and the physical sciences.This book will appeal to practising engineers and technicians working in the areas of RF, microwaves, communications, solid-state devices and radar. Senior students, researchers in microwave engineering and microelectronics and material scientists will also find this book a very useful reference.…