Refine your search
We were unable to find exact matches based on your search for "chikawa", "j", and "con".
Closest match to your search
- X-RAY TOPOGRAPHIC OBSERVATION OF DISLOCATION CONTRAST IN THIN CdS CRYSTALSChikawa, Jun-Ichi
- Softcover
- Used
US$ 4.95 shipping - DEFECTS AND PROPERTIES OF SEMICONDUCTORS: Defect EngineeringCHIKAWA, J; SUMINO, K; WADA, K [editors]
- Hardcover
- First Edition
- Used
US$ 29.71 shipping - Synchrotron Radiation in Chemistry and Biology IIAmemiya, Y. (Contributor)/ Mandelkow, Eckhard (Editor)/ Bartels, K. S. (Contributor)/ Chandesris, D. (Contributor)/ Chikawa, J. (Contributor)
- Softcover
- New
US$ 13.35 shipping - Defects and Properties of Semiconductors: Defect Engineering (Advances in Solid State Technology)
- Softcover
- New
US$ 16.00 shipping - Defects and Properties of Semiconductors: Defect EngineeringChikawa, J. (Editor) / Sumino, K. (Editor) / Wada, K. (Editor)
- Softcover
- New
US$ 13.35 shipping
