Chikawa (19 results)
Published by J Applied Physics, 1965
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Add to basketPamphlet. Condition: Very Good. Vol 36, No 11, pp. 3496-3502, Illus, 4to, Extracted from orig vol, thus begins with title page, trimmed & stapled pamphlet, else VGG.
Defects and Properties of Semiconductors: Defect Engineering (Advances in Solid State Technology, 3)
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Condition: very_good. Gently read. May have name of previous ownership, or ex-library edition. Binding tight; spine straight and smooth, with no creasing; covers clean and crisp. Minimal signs of handling or shelving. 100% GUARANTEE! Shipped with delivery confirmation, if you're not satisfied with purchase please return item! Sh…ips USPS Media Mail.
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Hb without Dj. Condition: Fine. First Edition. Contains nearly all the papers presented at the Symposium on "Defects and Qualities of Semiconductors" held in Tokyo in May 1984. In immaculate condition throughout. All profits to Amnesty International. Size: 15.5cm - 23.3cm with 261pp.
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Paperback. Condition: Brand New. 180 pages. 9.61x6.69x0.41 inches. In Stock.
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Defects and Properties of Semiconductors: Defect Engineering
Chikawa, J. (Editor) / Sumino, K. (Editor) / Wada, K. (Editor)
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Paperback. Condition: Brand New. 272 pages. 9.02x5.99x0.62 inches. In Stock.
Language: English
Published by Springer Netherlands, Springer Netherlands, 2011
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This volume contains nearly all of the papers presented at the Symposium on 'Defects and Qualities of Semiconductors' which was held in Tokyo on May 17-18, 1984, under the sponsorship of the SOCIETY OF NON-TRADITIONAL TECHNOLOGY. The Symposium was…organized by the promoting committee of the research project 'Quality Developement of Semiconductors by Utilization of Crystal Defects' sponsored by the Science and Technology Agency of Japan. Defect study in semiconductor engineering started originally with seeking methods how to suppress generation of harmful defects during device processing in order to achieve a high yield of device fabrication. Recently, a new trend has appeared in which crystal defects are positively utilized to improve the device performance and reliability. A typical example is the intrinsic gettering technique for Czochralski silicon. Thus, a new term 'DEFECT ENGINEERING' was born. It is becoming more important to control density and distribution of defects than to eliminate all the defects. Very precise and deep knowledge on defects is required to establish such techniques as generation and development of defects desired depending on type of devices and degree of integration. Electrical, optical and mechanical effects of defects should be also understood correctly. Such knowledge is essential even for eliminating defects from some specified device regions. It is the time now to investigate defect properties and defect kinetics in an energetic way. From this point of view, all the speakers in this symposium were invited among the most active investigators in the field of defect engineering in Japan.
More imagesPublished by 1917, 1917
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Add to basketAccordion-bound book. Size: 24.1 x 21.6 cm. Title and content in Japanese. With 19 colour woodblock-printed illustrations of different kabuki actors. Pasted on sprinkled paper. Silk covered boards, printed title paper label on front cover. Housed in cloth folder.Comprises eighteen famous kabuki plays selected by Ichikawa Danjuro… VII (1791-1859): Yanone, Nanatsumen, Gedatsu, Ja-Yanagi, Kamahige, Kagekiyo, Sukeroku, Uiro, Kanu, Fudo, Narukami, Zouhiki, Uwanari, Oshimodoshi, Kenuki, Shibaraku, Fuwa and Kanjincho. Several major Kabuki families made their own groups of "Eighteen Favourites" but no one managed to maintain a lasting fame as Danjuro VII's selection. Rare.
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Synchrotron radiation studies on insect flight muscle.- Protein single crystal diffraction.- Synchrotron light on ribosomes: The development of crystallographic studies of bacterial ribosomal particles.- Application o…f EXAFS to biochemical systems.- Structu.
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This volume contains nearly all of the papers presented at the Symposium on 'Defects and Qualities of Semiconductors' which was held in Tokyo on May 17-18, 1984, under the sponsorship of the SOCIETY OF NON-TRADITIONAL TECHNOLOGY. Th…e Symposium was organized by the promoting committee of the research project 'Quality Developement of Semiconductors by Utilization of Crystal Defects' sponsored by the Science and Technology Agency of Japan. Defect study in semiconductor engineering started originally with seeking methods how to suppress generation of harmful defects during device processing in order to achieve a high yield of device fabrication. Recently, a new trend has appeared in which crystal defects are positively utilized to improve the device performance and reliability. A typical example is the intrinsic gettering technique for Czochralski silicon. Thus, a new term 'DEFECT ENGINEERING' was born. It is becoming more important to control density and distribution of defects than to eliminate all the defects. Very precise and deep knowledge on defects is required to establish such techniques as generation and development of defects desired depending on type of devices and degree of integration. Electrical, optical and mechanical effects of defects should be also understood correctly. Such knowledge is essential even for eliminating defects from some specified device regions. It is the time now to investigate defect properties and defect kinetics in an energetic way. From this point of view, all the speakers in this symposium were invited among the most active investigators in the field of defect engineering in Japan. 272 pp. Englisch.
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This volume contains nearly all of the papers presented at the Symposium on Defects and Qualities of Semiconductors which was held in Tokyo on May 17-18, 1984, under the sponsorship of the SOCIETY OF NON-TRADITIONAL T…ECHNOLOGY. The Symposium was organized.
Language: English
Published by Springer Netherlands, Springer Dez 2011, 2011
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Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This volume contains nearly all of the papers presented at the Symposium on 'Defects and Qualities of Semiconductors' which was held in Tokyo on May 17-18, 1984, under the sponsorship of the SOCIETY OF NON-TRADITIONAL TECHNOLOGY. The Sy…mposium was organized by the promoting committee of the research project 'Quality Developement of Semiconductors by Utilization of Crystal Defects' sponsored by the Science and Technology Agency of Japan. Defect study in semiconductor engineering started originally with seeking methods how to suppress generation of harmful defects during device processing in order to achieve a high yield of device fabrication. Recently, a new trend has appeared in which crystal defects are positively utilized to improve the device performance and reliability. A typical example is the intrinsic gettering technique for Czochralski silicon. Thus, a new term 'DEFECT ENGINEERING' was born. It is becoming more important to control density and distribution of defects than to eliminate all the defects. Very precise and deep knowledge on defects is required to establish such techniques as generation and development of defects desired depending on type of devices and degree of integration. Electrical, optical and mechanical effects of defects should be also understood correctly. Such knowledge is essential even for eliminating defects from some specified device regions. It is the time now to investigate defect properties and defect kinetics in an energetic way. From this point of view, all the speakers in this symposium were invited among the most active investigators in the field of defect engineering in Japan.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 272 pp. Englisch.
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Taschenbuch. Condition: Neu. Defects and Properties of Semiconductors | Defect Engineering | J. Chikawa (u. a.) | Taschenbuch | Advances in Solid State Technology | 300 S. | Englisch | 2011 | Springer | EAN 9789401086165 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]h…artmann[at]springer[dot]com | Anbieter: preigu Print on Demand.
