Mass Market Paperback. Condition: Good. Please see any and all photos connected with this listing. A bit scuffed but all pages intact and legible. Good reading copies. Clean. Store Stamped. --- --- FINAL FLIGHT --- The most daring -- and deadly -- terrorist plot of all time is about to unfold aboard the supercarrier USS United States. If it succeeds, the balance of nuclear power will tilt in favor of a remorseless Arab leader. And it looks as if no one can stop it - except navy "jet jock" Jake Grafton. "Cag " Grafton is one helluva pilot. His F-14 Tomcat is one helluva plane. But some of Jake's crewmates have already vanished. A woman reporter who boarded the ship in Tangiers may not be who she claims to be. And Jake may have to disobey a direct order from the President himself for one spine-tingling, hair-raising Final Flight --- AMBUSH AT OSIRAK --- This military thriller centers on American counterspy David Llewelln's attempts to defuse an escalating Israeli/Iraqi conflict, save Iraq's Osirak atomic reactor from Israeli attack, and prevent a major international war. . .
Language: English
Published by CliffsNotes (edition 4), 2017
ISBN 10: 0544651081 ISBN 13: 9780544651081
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Language: English
Published by Wipf & Stock Publishers 1/18/2018, 2018
ISBN 10: 1532643667 ISBN 13: 9781532643668
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Paperback or Softback. Condition: New. The Field Is the World: A History of the Canton Mission (1929-1949) of the Churches of Christ. Book.
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Language: English
Published by Wipf and Stock 1/18/2018, 2018
ISBN 10: 1532643667 ISBN 13: 9781532643668
Paperback. New book. 152 pp.
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Language: English
Published by Wipf and Stock 2018-01, 2018
ISBN 10: 1532643667 ISBN 13: 9781532643668
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Published by Wipf and Stock Publishers, 2018
ISBN 10: 1532643667 ISBN 13: 9781532643668
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Language: English
Published by Springer Nature Switzerland AG, Cham, 2020
ISBN 10: 303053328X ISBN 13: 9783030533281
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Hardcover. Condition: new. Hardcover. This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on modelling measurement processes and quantifying their associated uncertainties. It covers everything from fundamentals to more advanced special topics, each illustrated with case studies from the authors' work in the Nuclear Security Enterprise (NSE). The material provides readers with a solid understanding of how to apply the techniques to metrology studies in a wide variety of contexts. The volume offers particular attention to uncertainty in decision making, design of experiments (DOEx) and curve fitting, along with special topics such as statistical process control (SPC), assessment of binary measurement systems, and new results on sample size selection in metrology studies. The methodologies presented are supported with R script when appropriate, and the code has been made available for readers to use in their own applications. Designed to promote collaboration between statistics and metrology, this book will be of use to practitioners of metrology as well as students and researchers in statistics and engineering disciplines. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Taschenbuch. Condition: Neu. Introduction to Statistics in Metrology | Stephen Crowder (u. a.) | Taschenbuch | xxi | Englisch | 2021 | Springer | EAN 9783030533311 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on modelling measurement processes and quantifying their associated uncertainties. It covers everything from fundamentals to more advanced special topics, each illustrated with case studies from the authors' work in the Nuclear Security Enterprise (NSE). The material provides readers with a solid understanding of how to apply the techniques to metrology studies in a wide variety of contexts. The volume offers particular attention to uncertainty in decision making, design of experiments (DOEx) and curve fitting, along with special topics such as statistical process control (SPC), assessment of binary measurement systems, and new results on sample size selection in metrology studies. The methodologies presented are supported with R script when appropriate, and the code has been made available for readers to use in their own applications. Designed to promote collaboration between statistics and metrology, this book will be of use to practitioners of metrology as well as students and researchers in statistics and engineering disciplines.
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on modelling measurement processes and quantifying their associated uncertainties. It covers everything from fundamentals to more advanced special topics, each illustrated with case studies from the authors' work in the Nuclear Security Enterprise (NSE). The material provides readers with a solid understanding of how to apply the techniques to metrology studies in a wide variety of contexts. The volume offers particular attention to uncertainty in decision making, design of experiments (DOEx) and curve fitting, along with special topics such as statistical process control (SPC), assessment of binary measurement systems, and new results on sample size selection in metrology studies. The methodologies presented are supported with R script when appropriate, and the code has been made available for readers to use in their own applications. Designed to promote collaboration between statistics and metrology, this book will be of use to practitioners of metrology as well as students and researchers in statistics and engineering disciplines.