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Denson William K (2 results)
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Technical Reliability Studies: EOS/ESD Technology Abstracts, Summer 1982
Published by Reliability Analysis Center, 1982
Softcover. Condition: with no dust jacket. Dust Jacket Condition: No Dust Jacket. Softcover. Ex-Corporate Library copy; with typical markings. Library label on front cover and on spine tail. Covers sunned. Light bumping on front cover corners. Small tear on bottom cover edge. Pages clean, but for library markings. ; TET22A; 11 x 8.25"; 287 pages; Ex-Library.
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Electrostatic discharge (ESD) susceptibility of electronic devices
Published by Reliability Analysis Center, Rome Air Development Center, 1983
Seller: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.
Seller rating 5 out of 5 stars
Condition: Very Good. 341 pp., softcover, very good. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
