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US$ 219.99
US$ 8.73 shipping
Ships from United Kingdom to U.S.A.Quantity: 3 available
Add to basketCondition: New. pp. 364.
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Condition: New. pp. 364.
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Advances in Imaging and Electron Physics: Selected problems of computational charged particle optics: Selected Problems of Computational Charged . . and Electron Physics): Vol. 155: Volume 155
Book 44 of 77: ISSNLanguage: English
Published by Academic Press 2009-02-16, 2009
ISBN 10: 0123747171 ISBN 13: 9780123747174
US$ 231.68
US$ 20.80 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketHardcover. Condition: New.
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Condition: New. pp. 364.
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Advances in Imaging and Electron Physics: Selected Problems of Computational Charged Particle Optics: Vol 155
Book 44 of 77: ISSNUS$ 259.42
US$ 16.78 shipping
Ships from United Kingdom to U.S.A.Quantity: 2 available
Add to basketHardcover. Condition: Brand New. 1st edition. 364 pages. 9.00x6.25x0.75 inches. In Stock.
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Advances in Imaging and Electron Physics: Selected Problems of Computational Charged Particle Optics
US$ 442.22
US$ 16.78 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketPaperback. Condition: Brand New. 364 pages. 9.00x6.00x0.82 inches. In Stock.
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Advances in Imaging and Electron Physics
Book 44 of 77: ISSNLanguage: English
Published by Elsevier Science & Technology, Academic Press, 2009
ISBN 10: 0123747171 ISBN 13: 9780123747174
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Advances in Imaging and Electron Physics merges two long-running serials Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This monograph summarizes the authors' knowledge and experience acquired over many years in their work on computational charged particle optics. Its main message is that even in this era of powerful computers with a multitude of general-purpose and problem-oriented programs, asymptotic analysis based on perturbation theory remains one of the most effective tools to penetrate deeply into the essence of the problem in question. Englisch.
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Condition: new. Questo è un articolo print on demand.
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Advances in Imaging and Electron Physics : Selected Problems of Computational Charged Particle Optics
Book 44 of 77: ISSNLanguage: English
Published by Elsevier Science & Technology, Academic Press, 2009
ISBN 10: 0123747171 ISBN 13: 9780123747174
Buch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Advances in Imaging and Electron Physics merges two long-running serials Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This monograph summarizes the authors' knowledge and experience acquired over many years in their work on computational charged particle optics. Its main message is that even in this era of powerful computers with a multitude of general-purpose and problem-oriented programs, asymptotic analysis based on perturbation theory remains one of the most effective tools to penetrate deeply into the essence of the problem in question.
