Eran Gur (6 results)

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  • Language: English

    Published by William Andrew 2013-11-18, 2013

    0323241433 / 9780323241434

    Series: Book 55 of 393 - Micro and Nano Technologies

    • Softcover

    Seller: Chiron Media, Wallingford, United KingdomChiron Media

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    Condition: New

    US$ 41.47

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    Quantity: Over 20 available

    Paperback. Condition: New. Brand new book, sourced directly from publisher. Dispatch time is 9-10 days from our warehouse. Book will be sent in robust, secure packaging to ensure it reaches you securely.

  • Language: English

    Published by William Andrew Pub, 2013

    0323241433 / 9780323241434

    Series: Book 55 of 393 - Micro and Nano Technologies

    • Hardcover

    Seller: Revaluation Books, Exeter, United KingdomRevaluation Books

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    Condition: New

    US$ 45.46

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    Hardcover. Condition: Brand New. 1st edition. 110 pages. 9.09x6.00x0.25 inches. In Stock.

  • Language: English

    Published by VDM Verlag, 2009

    3639147081 / 9783639147087

    • Softcover

    Seller: Mispah books, Redhill, SURRE, United KingdomMispah books

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    Condition: Used - As new

    US$ 179.28

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    Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

  • Language: English

    Published by Elsevier Science, 2013

    0323241433 / 9780323241434

    Series: Book 55 of 393 - Micro and Nano Technologies

    • Softcover
    • Print on Demand

    Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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    Condition: New

    US$ 67.73

    US$ 35.01 shipping 
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    Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists face the pressing problem in ULSI development and quality assurance: microscopy methods can't keep pace with the continuous shrinking of feature size in microelectronics. Nanometer scale sizes are below the resolution of light, and imaging these features is nearly impossible even with electron microscopes, due to image noise. This book presents novel 'smart' image processing methods, applications, and case studies concerning quality improvement of microscope images of microelectronic chips and process optimization. It explains an approach for high-resolution imaging of advanced metallization for micro- and nanoelectronics. This approach obviates the time-consuming preparation and selection of microscope measurement and sample conditions, enabling not only better electron-microscopic resolution, but also more efficient testing and quality control. This in turn leads to productivity gains in design and development of nano-scale ULSI chips. The authors also present several approaches for super-resolving low-resolution images to improve failure analysis of microelectronic chips.

  • Language: English

    Published by VDM Verlag Dr. Müller, 2009

    3639147081 / 9783639147087

    • Softcover
    • Print on Demand

    Seller: moluna, Greven, Germanymoluna

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    US$ 62.32

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    Kartoniert / Broschiert. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Gur EranEran Gur Received his B.Sc. in Electrical Engineering in 1991, nfrom Tel Aviv University. He received his M.Sc. in Electrical nEngineering in 1998 and his PhD in 2004, both from Tel Aviv nUniversity. Eran Gur is a Senior Facu.

  • Language: English

    Published by VDM Verlag Dr. Müller, 2009

    3639147081 / 9783639147087

    • Softcover
    • Print on Demand

    Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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    Condition: New

    US$ 114.58

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    Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This book, Modular optical systems for nonlinear data processing and manipulation, presents the PhD thesis under the same name, submitted in 2003. The work combines knowledge in image processing, switching in communication networks and knowledge in modern optics, especially in the field of Diffractive Optical Elements (D.O.E). The main topics covered in this book are: Multi stage binary phase-only image processing, Optical multi stage interconnection network (MIN) optimization, Optical implementation of non-linear operators such as the Volterra operators, and Optical implementation of Fuzzy logic controllers. This book covers a variety of fields relevant for electrical engineers interested in exploring the wonderful world of optics from the system designer point of view and offer a window to some of the most fascinating applications of optical systems.