Published by Duell, Sloan and Pearce, New York, 1962
Seller: Blue Moon Books, Stevens Point, WI, U.S.A.
First Edition
Cloth. Condition: Very Good. First Edition. VG++/fair. Hardcover with dust jacket. Light staining to front cover. Dust jacket has 2" tear on head of spine and front corner with heavy creasing on front cover. 1" tear on spine foot with moderate edgewear. First edition. 1962. Nice solid copy.
Published by Duell Sloan and Pearce, NY, 1962
Seller: Clausen Books, RMABA, Colorado Springs, CO, U.S.A.
First Edition
Cloth. Condition: Good. Dust Jacket Condition: Good (in mylar). Photos (illustrator). First Edition. Retired library copy, usual stamps, stickers, labels, markings, and surface-scuffed front free end paper fron the removal of the card pocket; Library stamped top and bottom edges. Cloth, bumped at the head and foot of the spine. Unclipped dust jacket, slight tilt to the spine, library labels on the foot of the spine, soiled covers, mylar sleeved. 173p. Size: 8vo - over 7¾" - 9¾" tall. Ex-Library Hardcover.
Published by American Museum of Natural History, New York, 1998
PAPERBACK. Paper edition. 376pp, numerous bw illustrations, octavo paper. Bulletin of the American Museum of Natural History Number 236. slight spine fading otherwise very good.
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Condition: New.
Paperback. Condition: New. The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Condition: As New. Unread book in perfect condition.
Seller: Revaluation Books, Exeter, United Kingdom
US$ 78.27
Quantity: 2 available
Add to basketPaperback. Condition: Brand New. 150 pages. 9.45x6.69x0.43 inches. In Stock.
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
US$ 77.43
Quantity: Over 20 available
Add to basketCondition: New.
Seller: Ria Christie Collections, Uxbridge, United Kingdom
US$ 83.63
Quantity: Over 20 available
Add to basketCondition: New. In.
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
US$ 82.02
Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
Language: English
Published by De Gruyter 2022-10-24, 2022
ISBN 10: 150152478X ISBN 13: 9781501524783
Seller: Chiron Media, Wallingford, United Kingdom
US$ 82.04
Quantity: Over 20 available
Add to basketPaperback. Condition: New.
Seller: Majestic Books, Hounslow, United Kingdom
US$ 112.48
Quantity: 3 available
Add to basketCondition: New.
Paperback. Condition: New. The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.
Seller: Books Puddle, New York, NY, U.S.A.
Condition: New. 1st edition NO-PA16APR2015-KAP.
Paperback. Condition: New.
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
US$ 150.91
Quantity: Over 20 available
Add to basketCondition: New. 2022. Paperback. . . . . .
Seller: AHA-BUCH GmbH, Einbeck, Germany
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.
Seller: Kennys Bookstore, Olney, MD, U.S.A.
Condition: New. 2022. Paperback. . . . . . Books ship from the US and Ireland.
Language: English
Published by Taylor & Francis Ltd Okt 2019, 2019
ISBN 10: 1138628743 ISBN 13: 9781138628748
Seller: AHA-BUCH GmbH, Einbeck, Germany
Buch. Condition: Neu. Neuware.
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies. 130 pp. Englisch.
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.deGruyter Boston, Genthiner Straße 13, 10785 Berlin 130 pp. Englisch.
Publication Date: 2025
Seller: True World of Books, Delhi, India
LeatherBound. Condition: New. BOOKS ARE EXEMPT FROM IMPORT DUTIES AND TARIFFS; NO EXTRA CHARGES APPLY. LeatherBound edition. Condition: New. Reprinted from 1956 edition. Leather Binding on Spine and Corners with Golden leaf printing on spine. Bound in genuine leather with Satin ribbon page markers and Spine with raised gilt bands. A perfect gift for your loved ones. Pages: 1300 NO changes have been made to the original text. This is NOT a retyped or an ocr'd reprint. Illustrations, Index, if any, are included in black and white. Each page is checked manually before printing. As this print on demand book is reprinted from a very old book, there could be some missing or flawed pages, but we always try to make the book as complete as possible. Fold-outs, if any, are not part of the book. If the original book was published in multiple volumes then this reprint is of only one volume, not the whole set. Sewing binding for longer life, where the book block is actually sewn (smythe sewn/section sewn) with thread before binding which results in a more durable type of binding. Pages: 1300 Volume 545 (1956) - 624 (1961).