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Ghavami Behnam (32 results)
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Condition: As New. Unread book in perfect condition.
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Condition: New. 1st ed. 2021 edition NO-PA16APR2015-KAP.
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US$ 64.36
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Soft Error Reliability of Vlsi Circuits : Analysis and Mitigation Techniques
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Seller rating 5 out of 5 stars
US$ 76.01
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Condition: New.
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Soft Error Reliability of Vlsi Circuits : Analysis and Mitigation Techniques
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Add to basketHardcover. Condition: Brand New. 127 pages. 9.25x6.10x9.21 inches. In Stock.
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Condition: As New. Unread book in perfect condition.
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Lifetime Reliability-Aware Design of Integrated Circuits
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
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Condition: New.
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Taschenbuch. Condition: Neu. Soft Error Reliability of VLSI Circuits | Analysis and Mitigation Techniques | Behnam Ghavami (u. a.) | Taschenbuch | xiii | Englisch | 2021 | Springer | EAN 9783030516123 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Lifetime Reliability-Aware Design of Integrated Circuits
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Add to basketPaperback. Condition: Brand New. 120 pages. 9.25x6.10x0.28 inches. In Stock.
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Add to basketHardcover. Condition: Brand New. 120 pages. 9.25x6.10x9.21 inches. In Stock.
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Lifetime Reliability-aware Design of Integrated Circuits
Language: English
Published by Springer International Publishing, Springer Nature Switzerland Nov 2022, 2022
ISBN 10: 3031153448 ISBN 13: 9783031153440
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. Neuware -This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 124 pp. Englisch.
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Lifetime Reliability-aware Design of Integrated Circuits
Language: English
Published by Springer International Publishing, 2023
ISBN 10: 3031153472 ISBN 13: 9783031153471
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.
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Lifetime Reliability-aware Design of Integrated Circuits
Language: English
Published by Springer International Publishing, 2022
ISBN 10: 3031153448 ISBN 13: 9783031153440
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.
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Condition: Hervorragend. Zustand: Hervorragend | Sprache: Englisch | Produktart: Bücher | This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.
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Condition: new. Questo è un articolo print on demand.
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Condition: new. Questo è un articolo print on demand.
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Condition: New. Print on Demand.
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Condition: New. PRINT ON DEMAND.
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Soft Error Reliability of VLSI Circuits
Language: English
Published by Springer, Berlin|Springer International Publishing|Springer, 2021
ISBN 10: 3030516121 ISBN 13: 9783030516123
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniqu.
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Soft Error Reliability of VLSI Circuits
Language: English
Published by Springer International Publishing, 2020
ISBN 10: 3030516091 ISBN 13: 9783030516093
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides an accessible, comprehensive introduction to soft errorsDescribes an easy to follow procedure for modeling, analysis, and estimation of soft error rate of digital circuitsIncludes state-of-the art soft error aware CAD algorithms.
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Lifetime Reliability-aware Design of Integrated Circuits
Language: English
Published by Springer International Publishing Nov 2023, 2023
ISBN 10: 3031153472 ISBN 13: 9783031153471
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits. 124 pp. Englisch.
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Lifetime Reliability-aware Design of Integrated Circuits
Language: English
Published by Springer International Publishing Nov 2022, 2022
ISBN 10: 3031153448 ISBN 13: 9783031153440
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits. 124 pp. Englisch.
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US$ 131.82
US$ 8.57 shipping
Ships from United Kingdom to U.S.A.Quantity: 4 available
Add to basketCondition: New. Print on Demand.
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Condition: New. PRINT ON DEMAND.
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Lifetime Reliability-aware Design of Integrated Circuits
Language: English
Published by Springer International Publishing, 2023
ISBN 10: 3031153472 ISBN 13: 9783031153471
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides an easy-to-follow procedure for analyzing lifetime reliability of nano-scale digital circuitsDescribes state-of-the art aging- and process variation-aware CAD algorithmsIncludes reliability improvement techniques for common clocked.
