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Goldstein Joseph Newbury Dale E Joy David C Lyman Charles E Echlin Patrick Lifshin Eric Sawyer Linda Michael J R (15 results)
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hardcover. Condition: Very Good. Hardback. No dust jacket. Cover edges and corners in good shape. Cover in good shape with some minimal signs of normal wear. There is a very small sticker on spine at bottom. Spine is a bit loose at top and tight at bottom. Pages are clean, no markings, notes or stains. Includes CD. Ships from Friends bookstore to benefit Beaverton (Oregon) library.
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Scanning Electron Microscopy a
Seller: World of Books (was SecondSale), Montgomery, IL, U.S.A.
Seller rating 5 out of 5 stars
Condition: Good. Item in good condition. Textbooks may not include supplemental items i.e. CDs, access codes etc.
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Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Seller: St Vincent de Paul of Lane County, Eugene, OR, U.S.A.
Seller rating 5 out of 5 stars
Condition: Acceptable. COVER SHOWS SOME GENERAL WEAR, SUCH AS SCRATCHES, RUBBING, CREASES OR COSMETIC DAMAGE. hardcover 100% of proceeds go to charity! Acceptable reading copy with obvious signs of use, wear, and/or cosmetic issues. Item is complete and remains readable despite notable condition issues.
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hardcover. Condition: New. Ship within 24hrs. 100% Satisfaction is Our #1 Goal!
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 103.91
US$ 15.73 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In English.
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hardcover. Condition: new.
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Scanning Electron Microscopy and X-Ray Microanalysis
Published by Springer-Verlag New York Inc., US, 2013
ISBN 10: 1461349699 ISBN 13: 9781461349693
Language: English
Seller: Rarewaves.com USA, London, LONDO, United Kingdom
Seller rating 5 out of 5 stars
Paperback. Condition: New. Third Edition 2003.
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Condition: New. pp. xix + 689 3rd Edition.
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Condition: New. pp. xix + 689 232 Illus.
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Scanning Electron Microscopy and X-Ray Microanalysis
Published by Springer-Verlag New York Inc., US, 2013
ISBN 10: 1461349699 ISBN 13: 9781461349693
Language: English
US$ 149.00
US$ 85.37 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketPaperback. Condition: New. Third Edition 2003.
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The text has been used in educating over 3,000 students at the Lehigh SEM short course as well as thousands of undergraduate and graduate students at universities in every corner of the globeThe authors have made extensive changes to the text and .
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Condition: New. PRINT ON DEMAND pp. xix + 689.
