Gray Kirk A (20 results)
Next Generation HALT and HASS: Robust Design of Electronics and Systems (Quality and Reliability Eng
Language: English
Published by Wiley, 2016
- Hardcover
Seller: Wrigley Books, Austin, TX, U.S.A.Wrigley Books
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hardcover. Condition: very good. Used items may not include media like access codes or CDs. Fast shipping! Expedited orders take 1-3 business days! Media mail may take up to 5 business days.
Language: English
Published by Wiley, 2016
- Hardcover
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HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.
Language: English
Published by Wiley, 2016
- Hardcover
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Language: English
Published by Wiley, 2016
- Hardcover
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Condition: new.
Language: English
Published by Wiley, 2016
- Hardcover
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Condition: As New. Unread book in perfect condition.
Language: English
Published by Wiley, 2016
- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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Condition: New. In English.
Language: English
Published by Wiley, 2016
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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Condition: New.
Language: English
Published by John Wiley and Sons Inc, US, 2016
- Hardcover
Seller: Rarewaves.com USA, London, LONDO, United KingdomRarewaves.com USA
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Hardback. Condition: New. NEXT GENERATION HALT AND HASS ROBUST DESIGN OF ELECTRONICS AND SYSTEMS A NEW APPROACH TO DISCOVERING AND CORRECTING SYSTEMS RELIABILITY RISKS Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This… is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics of failure based robust product and process development methodology. The new methodologies challenge misleading and sometimes costly misapplication of probabilistic failure prediction methods (FPM) and provide a new deterministic map for reliability development. The authors clearly explain the new approach with a logical progression of problem statement and solutions. The book helps engineers employ HALT and HASS by demonstrating why the misleading assumptions used for FPM are invalid. Next, the application of HALT and HASS empirical discovery methods to quickly find unreliable elements in electronics systems gives readers practical insight into the techniques. The physics of HALT and HASS methodologies are highlighted, illustrating how they uncover and isolate software failures due to hardware-software interactions in digital systems. The use of empirical operational stress limits for the development of future tools and reliability discriminators is described. Key features: Provides a clear basis for moving from statistical reliability prediction models to practical methods of insuring and improving reliability.Challenges existing failure prediction methodologies by highlighting their limitations using real field data.Explains a practical approach to why and how HALT and HASS are applied to electronics and electromechanical systems.Presents opportunities to develop reliability test discriminators for prognostics using empirical stress limits.Guides engineers and managers on the benefits of the deterministic and more efficient methods of HALT and HASS.Integrates the empirical limit discovery methods of HALT and HASS into a physics of failure based robust product and process development process.
Language: English
Published by Wiley, 2016
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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Condition: As New. Unread book in perfect condition.
Language: English
Published by John Wiley & Sons Inc, 2016
- Hardcover
Seller: THE SAINT BOOKSTORE, Southport, United KingdomTHE SAINT BOOKSTORE
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Hardback. Condition: New. New copy - Usually dispatched within 4 working days.
Language: English
Published by Wiley, 2016
- Hardcover
Seller: California Books, Miami, FL, U.S.A.California Books
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Language: English
Published by John Wiley & Sons Inc, 2016
- Hardcover
- First Edition
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrelandKennys Bookshop and Art Galleries Ltd.
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Condition: New. Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. Series: Quality and Reliability Engineering Series. Num Pages: 280 pages. BIC Classification: TGPR; TJF. Category: (P) Professional & Vocational. Dimension:… 229 x 152. . . 2016. 1st Edition. Hardcover. . . . .
Language: English
Published by John Wiley & Sons Inc, 2016
- Hardcover
Seller: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore
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Condition: New. Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. Series: Quality and Reliability Engineering Series. Num Pages: 280 pages. BIC Classification: TGPR; TJF. Category: (P) Professional & Vocational. Dimension:… 229 x 152. . . 2016. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.
Language: English
Published by John Wiley & Sons Inc, 2016
- Hardcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
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US$ 181.08
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Hardcover. Condition: Brand New. 1st edition. 296 pages. 9.00x6.25x0.75 inches. In Stock.
Language: English
Published by John Wiley and Sons Inc, US, 2016
- Hardcover
Seller: Rarewaves.com UK, London, United KingdomRarewaves.com UK
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US$ 134.57
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Hardback. Condition: New. NEXT GENERATION HALT AND HASS ROBUST DESIGN OF ELECTRONICS AND SYSTEMS A NEW APPROACH TO DISCOVERING AND CORRECTING SYSTEMS RELIABILITY RISKS Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This… is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics of failure based robust product and process development methodology. The new methodologies challenge misleading and sometimes costly misapplication of probabilistic failure prediction methods (FPM) and provide a new deterministic map for reliability development. The authors clearly explain the new approach with a logical progression of problem statement and solutions. The book helps engineers employ HALT and HASS by demonstrating why the misleading assumptions used for FPM are invalid. Next, the application of HALT and HASS empirical discovery methods to quickly find unreliable elements in electronics systems gives readers practical insight into the techniques. The physics of HALT and HASS methodologies are highlighted, illustrating how they uncover and isolate software failures due to hardware-software interactions in digital systems. The use of empirical operational stress limits for the development of future tools and reliability discriminators is described. Key features: Provides a clear basis for moving from statistical reliability prediction models to practical methods of insuring and improving reliability.Challenges existing failure prediction methodologies by highlighting their limitations using real field data.Explains a practical approach to why and how HALT and HASS are applied to electronics and electromechanical systems.Presents opportunities to develop reliability test discriminators for prognostics using empirical stress limits.Guides engineers and managers on the benefits of the deterministic and more efficient methods of HALT and HASS.Integrates the empirical limit discovery methods of HALT and HASS into a physics of failure based robust product and process development process.
Language: English
Published by Wiley, 2016
- Hardcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
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US$ 246.41
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Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
National Home Monthly Magazine, March (Mar.) 1942 - Hitler's Shadow Over South America / Lisbon - Capital of Intrigue
Stewart, Dr. H.L.; Titus, H.; Kirk, R.G.; Jackson, S.; Ellerbe, A. & P.; Strasser, Otto; Thornhill, M.; Clay, C.; Jaeckel, L.E.; Bayne, E.G.; Et al
Published by Home Publishing Company / National Home Monthly, Winnipeg, 1942
- Softcover
- First Edition
Seller: RareNonFiction, IOBA, Ladysmith, BC, CanadaRareNonFiction, IOBA
Contact seller5-star sellerAssociation member: IOBA
Condition: Used - Good
US$ 299.95
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Add to basketSingle Issue Magazine. Condition: Good. First Edition. 60 pages. Features: Classic black and white photo ad inside front cover for the Department of Munitions and Supply for Canada encourages readers not to stare at female war-effort workers wearing pants; News digest topics include conscription as 'total' war, why a plebescite?…, an embarassing pledge, and more; Fleischmann's Yeast one-page ad shows hungry Europeans contrasted with well-fed Canadians; Hitler's Shadow over South America - article by Otto Strasser; Britain's Propaganda Agent No. 1 - Big Ben - photo-illustrated article on big bells and their importance; Hang on to Your Hat (short story); The River Brethren (short story); Assignment in Monte Carlo (short story); Canada Gets Scrappy with Scrap - scrap metal is used to support the war effort; Lisbon - Capital of Intrigue - fascinating photo-illustrated article on counter-espionage work in Portugal; Incurable (short story); India - war-related photos at home and abroad, including the Maharaja of Jodhpur, the Maharaja of Gwalior, the Maharaja of Patiala, and Begum Shah Nawaz; Vintage half-page ad by this publication offers bicycle 'Make-a-Lite Generator' to children who sell subscriptions; Appraisal of the best screen voices - article with photos of Conrad Veidt, Merle Oberon, and others; Pepsodent ad features photos of twins Lucille and Lorayne Usack; Woodbury ads feature photos of Bette de Lesseps of Toronto and actress Laraine Day; Article from the Kitchen suggests savings to 'help lick Hitler'; Fashion illustrations; Article on Canadian women; Photo of kissing children submitted by Mrs. J.B. Foster of Sexsmith, Alberta; Hollywood Patterns ad inside back cover lists the 600 outlets nationwide where their products are solf; Back cover Victory Bonds ad for the National War Finance Committee shows man looking in the mirror; and more. Unmarked with average wear. A sound copy of this excellent wartime issue. Gray, Corinne; Warner, Charles F.; Adair, John; Holmgren, John; Clymer, John F. (illustrator).
Language: English
Published by John Wiley & Sons Inc, 2016
- Hardcover
- Print on Demand
Seller: THE SAINT BOOKSTORE, Southport, United KingdomTHE SAINT BOOKSTORE
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Hardback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 533.
Language: English
Published by John Wiley & Sons Inc, 2016
- Hardcover
- Print on Demand
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
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Hardcover. Condition: Brand New. 1st edition. 296 pages. 9.00x6.25x0.75 inches. In Stock. This item is printed on demand.
Language: English
Published by John Wiley & Sons Inc, New York, 2016
- Hardcover
- First Edition
- Print on Demand
Seller: CitiRetail, Stevenage, United KingdomCitiRetail
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Hardcover. Condition: new. Hardcover. NEXT GENERATION HALT AND HASS ROBUST DESIGN OF ELECTRONICS AND SYSTEMS A NEW APPROACH TO DISCOVERING AND CORRECTING SYSTEMS RELIABILITY RISKS Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability… risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics of failure based robust product and process development methodology. The new methodologies challenge misleading and sometimes costly misapplication of probabilistic failure prediction methods (FPM) and provide a new deterministic map for reliability development. The authors clearly explain the new approach with a logical progression of problem statement and solutions. The book helps engineers employ HALT and HASS by demonstrating why the misleading assumptions used for FPM are invalid. Next, the application of HALT and HASS empirical discovery methods to quickly find unreliable elements in electronics systems gives readers practical insight into the techniques. The physics of HALT and HASS methodologies are highlighted, illustrating how they uncover and isolate software failures due to hardwaresoftware interactions in digital systems. The use of empirical operational stress limits for the development of future tools and reliability discriminators is described. Key features: Provides a clear basis for moving from statistical reliability prediction models to practical methods of insuring and improving reliability.Challenges existing failure prediction methodologies by highlighting their limitations using real field data.Explains a practical approach to why and how HALT and HASS are applied to electronics and electromechanical systems.Presents opportunities to develop reliability test discriminators for prognostics using empirical stress limits.Guides engineers and managers on the benefits of the deterministic and more efficient methods of HALT and HASS.Integrates the empirical limit discovery methods of HALT and HASS into a physics of failure based robust product and process development process. Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
