Order Total (1 Item Items):
Shipping Destination:
Hetzel William C Editor (1 results)
Skip to main search results
Search filters
Product Type
- All Product Types
- Books (1)
- Magazines & Periodicals (No further results match this refinement)
- Comics (No further results match this refinement)
- Sheet Music (No further results match this refinement)
- Art, Prints & Posters (No further results match this refinement)
- Photographs (No further results match this refinement)
- Maps (No further results match this refinement)
- Manuscripts & Paper Collectibles (No further results match this refinement)
Condition Learn more
- New (No further results match this refinement)
- As New, Fine or Near Fine (No further results match this refinement)
- Very Good or Good (1)
- Fair or Poor (No further results match this refinement)
- As Described (No further results match this refinement)
Binding
- All Bindings
- Hardcover (1)
- Softcover (No further results match this refinement)
Collectible Attributes
- First Edition (No further results match this refinement)
- Signed (No further results match this refinement)
- Dust Jacket (1)
- Seller-Supplied Images (No further results match this refinement)
- Not Print on Demand (1)
Language (1)
Price
- Any Price
- Under US$ 25 (No further results match this refinement)
- US$ 25 to US$ 50
- Over US$ 50 (No further results match this refinement)
Free Shipping
- Free Shipping to U.S.A. (No further results match this refinement)
Seller Location
Seller Rating
-
Hardcover. Condition: UsedGood. Hardcover; based on the proceedings of the Computer Program Test Methods Symposium held at the University of North Carolina, Chapel Hill, June 21-23, 1972; surplus library copy with the usual stampings; reference number taped to dust jacket spine; otherwise in good condition with clean text, firm binding. Dust jacket, fading and shelf wear, protected by a Mylar cover.
