Seller: ThriftBooks-Dallas, Dallas, TX, U.S.A.
Unknown. Condition: Fair. No Jacket. Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less.
paperback. Condition: Very Good. Connecting readers with great books since 1972! Used books may not include companion materials, and may have some shelf wear or limited writing. We ship orders daily and Customer Service is our top priority!
Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
Language: English
Published by John Wiley & Sons Inc, 1965
Seller: OddReads, Harper, TX, U.S.A.
Hardcover. Condition: Good. The SIAM Series in Applied Mathematics; creased and edgeworn dust jacket.
Seller: books4less (Versandantiquariat Petra Gros GmbH & Co. KG), Welling, Germany
gebundene Ausgabe. Condition: Gut. 256 Seiten Das hier angebotene Buch stammt aus einer teilaufgelösten Bibliothek und kann die entsprechenden Kennzeichnungen aufweisen (Rückenschild, Instituts-Stempel.); der Buchzustand ist ansonsten ordentlich und dem Alter entsprechend gut. In ENGLISCHER Sprache. Sprache: Englisch Gewicht in Gramm: 530.
Language: English
Published by Society for Industrial & Applied, 1996
ISBN 10: 0898713692 ISBN 13: 9780898713695
Seller: Revaluation Books, Exeter, United Kingdom
US$ 111.30
Quantity: 1 available
Add to basketPaperback. Condition: Brand New. reprint edition. 258 pages. 9.25x6.25x0.75 inches. In Stock.
Published by John Wiley & Sons, New York, 1965
First Edition
Hardcover. Condition: Near Fine. Dust Jacket Condition: Very Good. 1st Edition. John Wiley & Sons, New York. 1965. 256 pages with index. First edition, first printing. Book is tight. Binding and hinges are strong and sound. Panels, pages and endpapers are all bright and clean. Book would grade fine if not for light shelf-rubbing along edges. Original, rare DJ shows a couple of small edge chips, mostly at crown and heel. Co-authors, Richard Barlow and Frank Proschan, noted American mathematicians/statisticians, are considered the founders of modern reliability theory. This is the rare first edition, first printing of their monumental book on the subject. Rare in DJ. Near fine/VG.