Imec (3 results)

Encuadernación de tapa blanda. Condition: Muy bueno.

Buch. Condition: Neu. Neuware - This book covers one of the most important device architectures that have been widely researched to extend the transistor scaling: FinFET. Starting with theory, the book discusses the advantages and the integration challenges of this device architecture. It addresses in detail the topics such as high-density fin patterning, gate stack design, and source/drain engineering, which have been considered challenges for the integration of FinFETs. The book also addresses circuit-related aspects, including the impact of variability on SRAM design, ESD design, and high-T operation. It discusses a new device concept: the junctionless nanowire FET.…

Pas de couverture. Condition: bon. RO80214929: 2004. In-8. En feuillets. Bon état, Couv. convenable, Dos satisfaisant, Intérieur frais. En feuillets d'environ 10 pages. quelques photographies en noir et blanc dans le texte. . . . Classification Dewey : 0-GENERALITES.