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Joseph B Bender (20 results)
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Condition: New.
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Lost in an Idyll (Paperback or Softback)
Language: English
Published by Joseph Bender 2/8/2013, 2013
ISBN 10: 0615763669 ISBN 13: 9780615763668
Paperback or Softback. Condition: New. Lost in an Idyll. Book.
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Condition: As New. Unread book in perfect condition.
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Softcover. Condition: Good. Softcover; fading, light soiling, and shelf wear to exterior; covers peeling slightly at corners; otherwise contents in good condition with clean text, firm binding.
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Lost in an Idyll
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 15.40
US$ 19.75 shipping
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Lost in an Idyll
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 15.43
US$ 19.75 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
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Condition: New.
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Condition: As New. Unread book in perfect condition.
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Reliability Prediction for Microelectronics (Quality and Reliability Engineering Series)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 137.63
US$ 15.77 shipping
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Reliability Prediction for Microelectronics
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 133.66
US$ 19.75 shipping
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Reliability Prediction for Microelectronics
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 146.65
US$ 19.75 shipping
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Reliability Prediction for Microelectronics
Language: English
Published by John Wiley and Sons Inc, US, 2024
ISBN 10: 1394210930 ISBN 13: 9781394210930
Seller: Rarewaves.com USA, London, LONDO, United Kingdom
Seller rating 5 out of 5 stars
Hardback. Condition: New. RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality and Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the 'physics of failure', combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditionsDetailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and moreNew multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.
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US$ 173.96
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Reliability Prediction for Microelectronics
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
First Edition
US$ 177.86
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Ships from Ireland to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. 2024. 1st Edition. hardcover. . . . . .
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Condition: New. 1st edition NO-PA16APR2015-KAP.
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Condition: New. 2024. 1st Edition. hardcover. . . . . . Books ship from the US and Ireland.
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Reliability Prediction for Microelectronics
Language: English
Published by John Wiley & Sons Inc, 2024
ISBN 10: 1394210930 ISBN 13: 9781394210930
Condition: Gut. Zustand: Gut | Seiten: 384 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
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Reliability Prediction for Microelectronics
Language: English
Published by John Wiley and Sons Inc, US, 2024
ISBN 10: 1394210930 ISBN 13: 9781394210930
US$ 159.55
US$ 85.57 shipping
Ships from United Kingdom to U.S.A.Quantity: 10 available
Add to basketHardback. Condition: New. RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality and Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the 'physics of failure', combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditionsDetailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and moreNew multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.
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Lost in an Idyll
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
US$ 15.42
US$ 15.44 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketPaperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
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![Seller image for Parapsychologie. Die Wissenschaft von den «okkulten» Erscheinungen. Methodik und Theorie. Mit Beiträgen von Dr. J. B. Rhine [] und Dr. Hans Bender []. for sale by Antiquariat Uhlmann](https://pictures.abebooks.com/inventory/md/md31883068238.jpg)
Parapsychologie. Die Wissenschaft von den «okkulten» Erscheinungen. Methodik und Theorie. Mit Beiträgen von Dr. J. B. Rhine [] und Dr. Hans Bender [].
Language: German
Published by Zürich, Rascher Verlag, 1952
Seller: Antiquariat Uhlmann, Zürich, Switzerland
Association Member: ILAB VEBUKU
Seller rating 5 out of 5 stars
OLwd. m. geprägtem Rücken- u. Deckeltitel u. OU. Gr.8°, 176 S. OU etw. unfrisch u. mit 2 Randrissen oben, Kopf- u. Seitenschnitt etw. stockfleckig, Buch sonst tadellos. 3. [, erweiterte] Auflage. Mit dem Vorwort von J. B. Rhine: «Über Hans Driesch» (3 S.); im Anhang: Hans Bender: «Zur Entwicklung der Parapsychologie von 1930 - 1950» (S. 135 ff.).
