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Joseph B Bernstein (39 results)
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Condition: good. Fast & Free Shipping â" Good condition. It may show normal signs of use, such as light writing, highlighting, or library markings, but all pages are intact and the book is fully readable. A solid, complete copy that's ready to enjoy.
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BAUDELAIRE RIMBAUD VERLAINE Selected Verse and Prose Poems
Published by THE CITADEL P RESS, NY, 1947
Hardcover. Condition: VG. Dust Jacket Condition: Good. small edge chips to the unclipped dj, clean copy.
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Sexology: Sex Science Magazine. An Authoritative Guide to Sex Education. Volume 19, No. 3 (October 1952)
Published by Sexology Magazine, New York, 1952
Ephemera. Soundly stapled binding. Pages clean, tanned. Wrappers tanned with light edge wear, light handling wear, overall light shelf wear. Contents: Gernsback, When is abortion legal? Wilson, Female sexual crimes. Secor, Artificial male organ. Bernstein, Menstruation without pain. Mozes, Eugene B., Premature birth, part 2. Cauldwell, The mechanics of mongolism. Winfield, Kidney stones. Branson, If you are Rh negative. Questions and answers, book reviews, sexological news, so they say, scientific sex notes. Line drawings, photographs; 7.5" (19 cm) tall; 64 pages. Very Good in No Dust Jacket dust jacket.
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Hardcover. Condition: Near Fine. Dust Jacket Condition: Good. Col. Francis Arnoldy and Joseph Bernstein (illustrator). 1st Edition. Tan textured paper-covered boards, lettered in red. 4th ptg.: Sept. 1943. Minor rubbing to extremities, slight moisture mark along lower front cover fore-edge. Firm binding, unmarked interior. Illus. dust jacket G with chipped spine extremities, corners rubbed, modest surface marks and rubs, 1" closed tear and related crease along bottom front panel edge, now in mylar. 251 pp. Size: 8vo - over 7¾" - 9¾" tall. Book.
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Condition: As New. Unread book in perfect condition.
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Reliability Prediction from Burn-In Data Fit to Reliability Models
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 70.63
US$ 19.75 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
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paperback. Condition: New. In shrink wrap. Looks like an interesting title!
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Harpers Monthly Magazine May 1930 / Philip S Bernstein "Religion In Russia" / Genevieve Parkhurst "German Women In Politics" / Bertrand Russell "Why Is Modern Youth Cynical?" / Owen Wister "Roosevelt And The 1912 Disaster" / Roark Bradford "Come Day. Go Day" (story) / Joseph Stagg Lawrence "The Futility Of Farm Relief" / Lee Foster Hartman "Master Builder" (story) / Katharine Fullerton Gerould "Our Substitute Live" / Myron M Stearns "Two Flights In The Fog" / Letitia Preston Randall "Rhapsody In Mauve" (story) / Brendan Lee "Fisherman's Luck" / John Langdon-Davies "Two Childhoods" / Louis L Dublin "Can We Extend The Life Span?"
Published by Harper & Brothers Publications, 1930
Magazine / Periodical
US$ 43.39
US$ 14.48 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketSoft cover. Condition: Very Good. 128 pages + 130 pages of 1930s period advertising. Philip S Bernstein "Religion In Russia" / Genevieve Parkhurst "German Women In Politics" / Bertrand Russell "Why Is Modern Youth Cynical?" / Owen Wister "Roosevelt And The 1912 Disaster" / Roark Bradford "Come Day. Go Day" (story) / Joseph Stagg Lawrence "The Futility Of Farm Relief" / Lee Foster Hartman "Master Builder" (story) / Katharine Fullerton Gerould "Our Substitute Live" / Myron M Stearns "Two Flights In The Fog" / Letitia Preston Randall "Rhapsody In Mauve" (story) / Brendan Lee "Fisherman's Luck" / John Langdon-Davies "Two Childhoods" / Louis L Dublin "Can We Extend The Life Span?" (U.P.).
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The Korean Electronics Industry
Book 3 of 3: The Electronics Industry Research SeriesLanguage: English
Published by Taylor & Francis Group, 1997
ISBN 10: 0849331722 ISBN 13: 9780849331725
Condition: New. pp. 144 1st Edition.
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Reliability Prediction from Burn-In Data Fit to Reliability Models
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 82.65
US$ 19.75 shipping
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The Korean Electronics Industry
Book 3 of 3: The Electronics Industry Research SeriesLanguage: English
Published by Taylor & Francis Group, 1997
ISBN 10: 0849331722 ISBN 13: 9780849331725
Condition: New. pp. 144.
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US$ 123.13
US$ 13.16 shipping
Ships from United Kingdom to U.S.A.Quantity: 2 available
Add to basketPaperback. Condition: Brand New. 1st edition. 126 pages. 9.25x6.25x0.50 inches. In Stock.
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Condition: New.
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US$ 105.76
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Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketPaperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Reliability Prediction for Microelectronics
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
US$ 133.67
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Ships from United Kingdom to U.S.A.Quantity: 15 available
Add to basketHRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.
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Condition: new.
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Condition: As New. Unread book in perfect condition.
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Condition: New. Satisfaction Guaranteed or your money back.
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Reliability Prediction for Microelectronics (Quality and Reliability Engineering Series)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 137.63
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Reliability Prediction for Microelectronics
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 133.66
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Reliability Prediction for Microelectronics
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 146.65
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Reliability Prediction for Microelectronics
Language: English
Published by John Wiley and Sons Inc, US, 2024
ISBN 10: 1394210930 ISBN 13: 9781394210930
Seller: Rarewaves.com USA, London, LONDO, United Kingdom
Seller rating 5 out of 5 stars
Hardback. Condition: New. RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality and Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the 'physics of failure', combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditionsDetailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and moreNew multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.
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Reliability Prediction for Microelectronics
Language: English
Published by John Wiley & Sons Inc, 2024
ISBN 10: 1394210930 ISBN 13: 9781394210930
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
US$ 159.05
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Add to basketHardback. Condition: New. New copy - Usually dispatched within 4 working days.
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US$ 173.96
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Reliability Prediction for Microelectronics
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
First Edition
US$ 177.86
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Add to basketCondition: New. 2024. 1st Edition. hardcover. . . . . .
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Condition: New. 1st edition NO-PA16APR2015-KAP.
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Condition: New. 2024. 1st Edition. hardcover. . . . . . Books ship from the US and Ireland.
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Reliability Prediction for Microelectronics
Language: English
Published by John Wiley & Sons Inc, 2024
ISBN 10: 1394210930 ISBN 13: 9781394210930
Condition: Gut. Zustand: Gut | Seiten: 384 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
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Reliability Prediction for Microelectronics
Language: English
Published by John Wiley and Sons Inc, US, 2024
ISBN 10: 1394210930 ISBN 13: 9781394210930
US$ 159.55
US$ 85.57 shipping
Ships from United Kingdom to U.S.A.Quantity: 10 available
Add to basketHardback. Condition: New. RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality and Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the 'physics of failure', combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditionsDetailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and moreNew multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.
