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David C. Buck, K. Paramasivam

Published by Scholars Press, USA (1997)

ISBN 10: 0788503324 ISBN 13: 9780788503320

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Item Description: Scholars Press, USA, 1997. Softcover. Book Condition: As New. A Translation of Kalaviyal Enra Iraiyanar Akapporul with Comentary by Nakkiranar: Book is in as new condition. Cover may have some minor wear from storage. Text appears to be clean. Quantity Available: 1. Shipped Weight: Under 1 kilo. ISBN: 0788503324. ISBN/EAN: 9780788503320. Pictures of this item not already displayed here available upon request. Inventory No: 1561041487. Bookseller Inventory # 1561041487

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Ranganathan C.R. Paramasivam P. Palanisami K

Published by Associated Publishing Company

ISBN 10: 8185211531 ISBN 13: 9788185211534

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Item Description: Associated Publishing Company. Book Condition: New. pp. viii + 209 Illus. Bookseller Inventory # 7743980

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K. Palanisami & P. Paramasivam & C.R. Ranganathan

Published by Associated Publishing Company, New Delhi (2006)

ISBN 10: 8185211620 ISBN 13: 9788185211626

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Item Description: Associated Publishing Company, New Delhi, 2006. Hardcover. Book Condition: New. Bookseller Inventory # 358174

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K Paramasivam

Published by LAP Lambert Academic Publishing 2012-07-18 (2012)

ISBN 10: 3659180769 ISBN 13: 9783659180767

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Item Description: LAP Lambert Academic Publishing 2012-07-18, 2012. paperback. Book Condition: New. Bookseller Inventory # 9783659180767

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Paramasivam, K.

Published by Dravidian Linguistics Assoc., Trivandrum (1979)

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Item Description: Dravidian Linguistics Assoc., Trivandrum, 1979. orig. wrappers. 24x17cm, 81 pp., Series: Dravidian Linguistics Association, Publication no. 28. Rubbed. Corner bumps. Spine tear. Good. Bookseller Inventory # 026886

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K. Palanisami, P. Paramasivam and C.R. Ranganathan

Published by Associated Publishing Company (2016)

ISBN 10: 8185211531 ISBN 13: 9788185211534

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Item Description: Associated Publishing Company, 2016. Hardcover. Book Condition: New. 2nd Edition. The Present book is unique in that it seeks to blend the theory of the Production Economics with empirical analysis of exclusively Indian situations. The applications presented here are from research works relating to local issues of the irrigation sector of the southern States of India, particularly Tamil Nadu. The material presented, both theoretical and empirical have been extensively classroom tested over the past two decades. The book contains twelve chapters. Starting with the first chapter on Agricultural Production Process- Selected Agro-economics Procedures explaining the production situation that are analyzed in the book. The second chapter Mathematical Analysis of Production Relationships presents a concise summary of the basic production economics theory forming the basis of subsequent chapters. The concept of the production function that forms the fundamental tool of production economics analysis is reviewed and its conceptual extensions leading to various decision making situations are explored. The subsequent chapters extend the basic theoretical analysis with illustrated empirical applications. These chapters cover the analytical approach to economic optimum, decision making with no risk and uncertainty in agriculture, trend/growth specifications and measurement of inequality, technology, input use and factor shares, economic efficiency in agricultural production, yield gaps, and yield penalties and yield declines. The final two chapters extend the analytical framework from production function analysis to programming approaches and the techniques of project evaluation. The lucid presentation of theory mingled with applications would make this book an ideal one for the graduate and postgraduate students specializing in production economics. Bookseller Inventory # 117707

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With Commentary by Nakkiranar; translated from Tamil by David C. Buck and K. Paramasivam

Published by Institut Francais de Pondichery (2017)

ISBN 10: 8184702167 ISBN 13: 9788184702163

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Item Description: Institut Francais de Pondichery, 2017. Hardcover. Book Condition: New. 2nd Edition. The Study of Stolen Love, with Nakkirar’s commentary, is the earliest Tamil prose work still in existence, and its influence remains clear and strong today. The work consists of three strands: A series of ancient Tamil sutras, Nakkirar’s explication of those sutras, and the elegantly beautiful ancient court poems he has chosen to illustrate his points. In so doing he lays out the prescribed conventions that govern the composition and appreciation of akam, or “interior” poems-often called ‘love’ poems-and their literary contexts, as well as the critical apparatus that has structured commentaries by classical Tamil scholars down through the centuries, including the current era. This translation was done collaboratively by David C. Buck and the late K. Paramasivam, and originally published in 1997. The revised edition revisits notes from the first edition, and includes a new Introduction that brings the work up to date and places the Tamil original more firmly in its historical context. Bookseller Inventory # 120937

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Paramasivam, K.

Published by LAP Lambert Academic Publishing (2016)

ISBN 10: 3659180769 ISBN 13: 9783659180767

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Item Description: LAP Lambert Academic Publishing, 2016. Paperback. Book Condition: New. PRINT ON DEMAND Book; New; Publication Year 2016; Not Signed; Fast Shipping from the UK. No. book. Bookseller Inventory # ria9783659180767_lsuk

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K Paramasivam

Published by LAP Lambert Academic Publishing (2012)

ISBN 10: 3659180769 ISBN 13: 9783659180767

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Item Description: LAP Lambert Academic Publishing, 2012. PAP. Book Condition: New. New Book. Delivered from our UK warehouse in 3 to 5 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Bookseller Inventory # LQ-9783659180767

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K Paramasivam

Published by LAP Lambert Academic Publishing (2012)

ISBN 10: 3659180769 ISBN 13: 9783659180767

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Item Description: LAP Lambert Academic Publishing, 2012. PAP. Book Condition: New. New Book. Shipped from US within 10 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Bookseller Inventory # IQ-9783659180767

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Paramasivam, K. / Gunavathi, K.

ISBN 10: 3659180769 ISBN 13: 9783659180767

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Item Description: Book Condition: New. Publisher/Verlag: LAP Lambert Academic Publishing | Test Vector Reordering Method for Minimizing Power Dissipation in VLSI Circuits using Functional Metrics | The book investigates test vector reordering algorithm for minimizing the power dissipation during testing of VLSI circuits. Testing plays a key role in design flow and is the major challenging task for design and test engineers. Power dissipation is critical problem during testing phase. The test vectors generated from Automatic Test Pattern Generator used for testing are statistically independent which leads to more power dissipation. The testing power can be reduced by reordering the sequence of test vectors. The reordering algorithm is developed using the graph theory with heuristic concept to find more sub-optimal solutions. Five functional metrics such as Cosine, Hamming, Mahalanobis, Minkowski and Seuclidean are considered for reordering the test vectors. Don t care replacement method is also proposed for reordered test set to reduce further the transitions in the CUT. Both the methods are implemented and simulated in ISCAS85 benchmark circuits to evaluate the transitions and average power. The results show that transitions and average power are reduced considerably for functions other than hamming distance when compared with unordered test set and existing methods. | Format: Paperback | Language/Sprache: english | 76 pp. Bookseller Inventory # K9783659180767

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K. Paramasivam; K. Gunavathi

Published by LAP Lambert Academic Publishing (2012)

ISBN 10: 3659180769 ISBN 13: 9783659180767

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Item Description: LAP Lambert Academic Publishing, 2012. Book Condition: New. This item is printed on demand for shipment within 3 working days. Bookseller Inventory # KP9783659180767

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K. Paramasivam; K. Gunavathi

Published by LAP Lambert Academic Publishing (2012)

ISBN 10: 3659180769 ISBN 13: 9783659180767

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Item Description: LAP Lambert Academic Publishing, 2012. Book Condition: New. This item is printed on demand for shipment within 3 working days. Bookseller Inventory # LP9783659180767

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David C. Buck (Translator), K. Paramasivam (Translator)

Published by Oxford University Press, USA (1997)

ISBN 10: 0788503324 ISBN 13: 9780788503320

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Item Description: Oxford University Press, USA, 1997. Paperback. Book Condition: New. Bookseller Inventory # DADAX0788503324

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K. Palanisami & P. Paramasivam & C.R. Ranganathan

Published by AGROTECH (2011)

ISBN 10: 8185211531 ISBN 13: 9788185211534

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Item Description: AGROTECH, 2011. Hardcover. Book Condition: New. New. book. Bookseller Inventory # F5S6-0-Z-8185211531-6

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K. Paramasivam

Published by LAP Lambert Academic Publishing Jul 2012 (2012)

ISBN 10: 3659180769 ISBN 13: 9783659180767

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Item Description: LAP Lambert Academic Publishing Jul 2012, 2012. Taschenbuch. Book Condition: Neu. Neuware - The book investigates test vector reordering algorithm for minimizing the power dissipation during testing of VLSI circuits. Testing plays a key role in design flow and is the major challenging task for design and test engineers. Power dissipation is critical problem during testing phase. The test vectors generated from Automatic Test Pattern Generator used for testing are statistically independent which leads to more power dissipation. The testing power can be reduced by reordering the sequence of test vectors. The reordering algorithm is developed using the graph theory with heuristic concept to find more sub-optimal solutions. Five functional metrics such as Cosine, Hamming, Mahalanobis, Minkowski and Seuclidean are considered for reordering the test vectors. Don t care replacement method is also proposed for reordered test set to reduce further the transitions in the CUT. Both the methods are implemented and simulated in ISCAS85 benchmark circuits to evaluate the transitions and average power. The results show that transitions and average power are reduced considerably for functions other than hamming distance when compared with unordered test set and existing methods. 76 pp. Englisch. Bookseller Inventory # 9783659180767

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K. Paramasivam

Published by LAP Lambert Academic Publishing Jul 2012 (2012)

ISBN 10: 3659180769 ISBN 13: 9783659180767

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Item Description: LAP Lambert Academic Publishing Jul 2012, 2012. Taschenbuch. Book Condition: Neu. Neuware - The book investigates test vector reordering algorithm for minimizing the power dissipation during testing of VLSI circuits. Testing plays a key role in design flow and is the major challenging task for design and test engineers. Power dissipation is critical problem during testing phase. The test vectors generated from Automatic Test Pattern Generator used for testing are statistically independent which leads to more power dissipation. The testing power can be reduced by reordering the sequence of test vectors. The reordering algorithm is developed using the graph theory with heuristic concept to find more sub-optimal solutions. Five functional metrics such as Cosine, Hamming, Mahalanobis, Minkowski and Seuclidean are considered for reordering the test vectors. Don t care replacement method is also proposed for reordered test set to reduce further the transitions in the CUT. Both the methods are implemented and simulated in ISCAS85 benchmark circuits to evaluate the transitions and average power. The results show that transitions and average power are reduced considerably for functions other than hamming distance when compared with unordered test set and existing methods. 76 pp. Englisch. Bookseller Inventory # 9783659180767

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Paramasivam, K.

Published by LAP LAMBERT Academic Publishing

ISBN 10: 3659180769 ISBN 13: 9783659180767

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Item Description: LAP LAMBERT Academic Publishing. Book Condition: Brand New. Ships from USA. FREE domestic shipping. Bookseller Inventory # 3659180769

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K Paramasivam, K Gunavathi

Published by LAP Lambert Academic Publishing, Germany (2012)

ISBN 10: 3659180769 ISBN 13: 9783659180767

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Item Description: LAP Lambert Academic Publishing, Germany, 2012. Paperback. Book Condition: New. Aufl.. Language: English . Brand New Book ***** Print on Demand *****.The book investigates test vector reordering algorithm for minimizing the power dissipation during testing of VLSI circuits. Testing plays a key role in design flow and is the major challenging task for design and test engineers. Power dissipation is critical problem during testing phase. The test vectors generated from Automatic Test Pattern Generator used for testing are statistically independent which leads to more power dissipation. The testing power can be reduced by reordering the sequence of test vectors. The reordering algorithm is developed using the graph theory with heuristic concept to find more sub-optimal solutions. Five functional metrics such as Cosine, Hamming, Mahalanobis, Minkowski and Seuclidean are considered for reordering the test vectors. Don t care replacement method is also proposed for reordered test set to reduce further the transitions in the CUT. Both the methods are implemented and simulated in ISCAS85 benchmark circuits to evaluate the transitions and average power. The results show that transitions and average power are reduced considerably for functions other than hamming distance when compared with unordered test set and existing methods. Bookseller Inventory # AAV9783659180767

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K. Paramasivam

Published by LAP Lambert Academic Publishing Jul 2012 (2012)

ISBN 10: 3659180769 ISBN 13: 9783659180767

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Item Description: LAP Lambert Academic Publishing Jul 2012, 2012. Taschenbuch. Book Condition: Neu. This item is printed on demand - Print on Demand Neuware - The book investigates test vector reordering algorithm for minimizing the power dissipation during testing of VLSI circuits. Testing plays a key role in design flow and is the major challenging task for design and test engineers. Power dissipation is critical problem during testing phase. The test vectors generated from Automatic Test Pattern Generator used for testing are statistically independent which leads to more power dissipation. The testing power can be reduced by reordering the sequence of test vectors. The reordering algorithm is developed using the graph theory with heuristic concept to find more sub-optimal solutions. Five functional metrics such as Cosine, Hamming, Mahalanobis, Minkowski and Seuclidean are considered for reordering the test vectors. Don t care replacement method is also proposed for reordered test set to reduce further the transitions in the CUT. Both the methods are implemented and simulated in ISCAS85 benchmark circuits to evaluate the transitions and average power. The results show that transitions and average power are reduced considerably for functions other than hamming distance when compared with unordered test set and existing methods. 76 pp. Englisch. Bookseller Inventory # 9783659180767

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K. Paramasivam

Published by LAP LAMBERT Academic Publishing

ISBN 10: 3659180769 ISBN 13: 9783659180767

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Item Description: LAP LAMBERT Academic Publishing. Paperback. Book Condition: New. Paperback. 76 pages. Dimensions: 8.7in. x 5.9in. x 0.2in.The book investigates test vector reordering algorithm for minimizing the power dissipation during testing of VLSI circuits. Testing plays a key role in design flow and is the major challenging task for design and test engineers. Power dissipation is critical problem during testing phase. The test vectors generated from Automatic Test Pattern Generator used for testing are statistically independent which leads to more power dissipation. The testing power can be reduced by reordering the sequence of test vectors. The reordering algorithm is developed using the graph theory with heuristic concept to find more sub-optimal solutions. Five functional metrics such as Cosine, Hamming, Mahalanobis, Minkowski and Seuclidean are considered for reordering the test vectors. Dont care replacement method is also proposed for reordered test set to reduce further the transitions in the CUT. Both the methods are implemented and simulated in ISCAS85 benchmark circuits to evaluate the transitions and average power. The results show that transitions and average power are reduced considerably for functions other than hamming distance when compared with unordered test set and existing methods. This item ships from multiple locations. Your book may arrive from Roseburg,OR, La Vergne,TN. Paperback. Bookseller Inventory # 9783659180767

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K. Paramasivam, K. Gunavathi

Published by LAP LAMBERT Academic Publishing (2012)

ISBN 10: 3659180769 ISBN 13: 9783659180767

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Item Description: LAP LAMBERT Academic Publishing, 2012. Paperback. Book Condition: New. This item is printed on demand. Bookseller Inventory # SONG3659180769

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Buck, David C.; Paramasivam, K.

ISBN 10: 0788503324 ISBN 13: 9780788503320

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Item Description: Paperback. Book Condition: Muy Bueno / Very Good. Bookseller Inventory # 100000000673966

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