Kurt Hingerl (18 results)

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  • Language: English

    Published by Springer, 2016

    3662519712 / 9783662519714

    • Softcover

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  • Language: English

    Published by Springer, 2013

    3642339557 / 9783642339554

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    Language: English

    Published by Springer, 2016

    3662519712 / 9783662519714

    • Softcover

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    Taschenbuch. Condition: Neu. Ellipsometry at the Nanoscale | Maria Losurdo (u. a.) | Taschenbuch | xxiv | Englisch | 2016 | Springer | EAN 9783662519714 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

  • Language: English

    Published by Springer, 2016

    3662519712 / 9783662519714

    • Softcover

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    Condition: New. In English.

  • Language: English

    Published by Springer, 2013

    3642339557 / 9783642339554

    • Hardcover

    Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections

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  • Language: English

    Published by Springer, 2016

    3662519712 / 9783662519714

    • Softcover

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  • Language: English

    Published by Springer, 2013

    3642339557 / 9783642339554

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  • Language: English

    Published by Springer Vieweg, 2016

    3662519712 / 9783662519714

    • Softcover

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    Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.…

  • Language: English

    Published by Springer Gabler, 2013

    3642339557 / 9783642339554

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    Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.…

  • Language: English

    Published by Springer Verlag, 2013

    3642339557 / 9783642339554

    • Hardcover

    Seller: Revaluation Books, Exeter, United KingdomRevaluation Books

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    Hardcover. Condition: Brand New. 2013 edition. 754 pages. French language. 9.25x6.25x1.75 inches. In Stock.

  • Language: English

    Published by Springer, 2013

    3642339557 / 9783642339554

    • Hardcover
    • Print on Demand

    Seller: Brook Bookstore On Demand, Napoli, NA, ItalyBrook Bookstore On Demand

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  • Language: English

    Published by Springer, 2016

    3662519712 / 9783662519714

    • Softcover
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  • Language: English

    Published by Springer Berlin Heidelberg, 2016

    3662519712 / 9783662519714

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    Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides different aspects and opinion on a rapidly evolving fieldReviews recent applications of polarimetric techniques to nanomaterialsWritten by renomed experts in the fieldThis book presents and introduces ellipsometry in nanosc.…

  • Language: English

    Published by Springer Berlin Heidelberg, 2013

    3642339557 / 9783642339554

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    Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides different aspects and opinion on a rapidly evolving fieldReviews recent applications of polarimetric techniques to nanomaterialsWritten by renomed experts in the fieldProvides different aspects and opinion on a rapidly e.…

  • Language: English

    Published by Springer Berlin Heidelberg Aug 2016, 2016

    3662519712 / 9783662519714

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    Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications. 756 pp. Englisch.…

  • Language: English

    Published by Springer Berlin Heidelberg Mrz 2013, 2013

    3642339557 / 9783642339554

    • Hardcover
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    Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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    Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications. 756 pp. Englisch.…

  • Language: English

    Published by Springer Berlin Heidelberg, Springer Berlin Heidelberg Aug 2016, 2016

    3662519712 / 9783662519714

    • Softcover
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    Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 756 pp. Englisch.…

  • Language: English

    Published by Springer Berlin Heidelberg, Springer Berlin Heidelberg Mär 2013, 2013

    3642339557 / 9783642339554

    • Hardcover
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    Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000

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    Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 756 pp. Englisch.…