Order Total (1 Item Items):
Shipping Destination:
Massimo Vanzi (13 results)
Skip to main search results
Search filters
Product Type
- All Product Types
- Books (13)
- Magazines & Periodicals (No further results match this refinement)
- Comics (No further results match this refinement)
- Sheet Music (No further results match this refinement)
- Art, Prints & Posters (No further results match this refinement)
- Photographs (No further results match this refinement)
- Maps (No further results match this refinement)
- Manuscripts & Paper Collectibles (No further results match this refinement)
Condition Learn more
- New (11)
- As New, Fine or Near Fine (2)
- Very Good or Good (No further results match this refinement)
- Fair or Poor (No further results match this refinement)
- As Described (No further results match this refinement)
Binding
- All Bindings
- Hardcover (13)
- Softcover (No further results match this refinement)
Collectible Attributes
- First Edition (No further results match this refinement)
- Signed (No further results match this refinement)
- Dust Jacket (No further results match this refinement)
- Seller-Supplied Images (5)
- Not Print on Demand (9)
Language (1)
Price
- Any Price
- Under US$ 25 (No further results match this refinement)
- US$ 25 to US$ 50 (No further results match this refinement)
- Over US$ 50
Free Shipping
- Free Shipping to U.S.A. (No further results match this refinement)
Seller Location
Seller Rating
-
Advanced Laser Diode Reliability
Language: English
Published by ISTE Press - Elsevier, 2021
ISBN 10: 1785481541 ISBN 13: 9781785481543
US$ 129.40
US$ 8.74 shipping
Ships from United Kingdom to U.S.A.Quantity: 3 available
Add to basketCondition: New.
-
Advanced Laser Diode Reliability
Language: English
Published by ISTE Press - Elsevier, 2021
ISBN 10: 1785481541 ISBN 13: 9781785481543
Condition: New.
-
Advanced Laser Diode Reliability
Language: English
Published by ISTE Press - Elsevier, 2021
ISBN 10: 1785481541 ISBN 13: 9781785481543
Condition: New. 1st edition NO-PA16APR2015-KAP.
-
Advanced Laser Diode Reliability
Language: English
Published by ISTE Press - Elsevier, 2021
ISBN 10: 1785481541 ISBN 13: 9781785481543
Condition: New.
-
Advanced Laser Diode Reliability
Language: English
Published by ISTE Press - Elsevier, 2021
ISBN 10: 1785481541 ISBN 13: 9781785481543
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 153.81
US$ 20.16 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
-
Advanced Laser Diode Reliability
Language: English
Published by ISTE Press Ltd - Elsevier Inc, 2021
ISBN 10: 1785481541 ISBN 13: 9781785481543
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
US$ 146.06
US$ 27.89 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketHardback. Condition: New. New copy - Usually dispatched within 4 working days.
-
Advanced Laser Diode Reliability
Language: English
Published by ISTE Press - Elsevier, 2021
ISBN 10: 1785481541 ISBN 13: 9781785481543
Condition: As New. Unread book in perfect condition.
-
Advanced Laser Diode Reliability (Durability, Robustness and Reliability of Photonic Devices)
Language: English
Published by ISTE Press - Elsevier, 2021
ISBN 10: 1785481541 ISBN 13: 9781785481543
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 161.58
US$ 16.10 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
-
Advanced Laser Diode Reliability
Language: English
Published by ISTE Press - Elsevier, 2021
ISBN 10: 1785481541 ISBN 13: 9781785481543
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 179.83
US$ 20.16 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
-
Advanced Laser Diode Reliability
Language: English
Published by Elsevier Science Ltd, 2021
ISBN 10: 1785481541 ISBN 13: 9781785481543
US$ 131.81
US$ 16.80 shipping
Ships from United Kingdom to U.S.A.Quantity: 2 available
Add to basketHardcover. Condition: Brand New. 258 pages. 9.00x6.00x0.75 inches. In Stock. This item is printed on demand.
-
Advanced Laser Diode Reliability
Language: English
Published by Elsevier Science & Technology, ISTE Press - Elsevier, 2021
ISBN 10: 1785481541 ISBN 13: 9781785481543
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction. Englisch.
-
Advanced Laser Diode Reliability
Language: English
Published by ISTE Press Ltd - Elsevier Inc, 2021
ISBN 10: 1785481541 ISBN 13: 9781785481543
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
US$ 193.99
US$ 27.89 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketHardback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
-
Advanced Laser Diode Reliability
Language: English
Published by Elsevier Science & Technology, ISTE Press - Elsevier, 2021
ISBN 10: 1785481541 ISBN 13: 9781785481543
Buch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction.
