Moebus L Frank (1 results)
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AUTOTESTCON '79, International AUTOMATIC TESTING Conference: 19-21 September 1979, Minneapolis, Minnesota
Moebus, L. Frank; Granieri, Michael N.; Jackson, Philip C.; et.al.
Published by IEEE; The Institute of Electrical and Electronic Engineers, Inc., New York, NY, U.S.A., 1979
- Softcover
- First Edition
Seller: SUNSET BOOKS 2, Newark, OH, U.S.A.SUNSET BOOKS 2
Contact seller5-star sellerCondition: Used - Very good
US$ 24.00
US$ 7.25 shippingShips within U.S.A.Quantity: 1 available
Add to basketPaperback. Condition: Very Good. No Jacket. 1st. 1 volume. W/full markings and pocket. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Size: 4to. Ex-Library.