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Mohammad Tehranipoor (152 results)
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Testing and Diagnosis for Small-Delay Defects.
Language: English
Published by New York, Springer New York., 2011
ISBN 10: 1441982965 ISBN 13: 9781441982964
Seller: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germany
Association Member: GIAQ ILAB VDA
Seller rating 5 out of 5 stars
XVIII, 212 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Stamped. Sprache: Englisch.
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Condition: Good. Ships SAME or NEXT business day. We Ship to APO/FPO addr. Choose EXPEDITED shipping and receive in 2-5 business days within the United States. See our member profile for customer support contact info. We have an easy return policy.
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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hardcover. Condition: Sehr gut. 435 Seiten; 9781441980793.2 Gewicht in Gramm: 1.
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Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
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Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Condition: New.
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Condition: New.
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Condition: New.
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Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
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Test and Diagnosis for Small-Delay Defects (Hardcover)
Language: English
Published by Springer-Verlag New York Inc., New York, NY, 2011
ISBN 10: 1441982965 ISBN 13: 9781441982964
Hardcover. Condition: new. Hardcover. This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise. This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Test and Diagnosis for Small-Delay Defects
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 125.91
US$ 16.40 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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US$ 126.20
US$ 21.20 shipping
Ships from United Kingdom to U.S.A.Quantity: 10 available
Add to basketPaperback. Condition: New.
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Condition: As New. Unread book in perfect condition.
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Condition: As New. Unread book in perfect condition.
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Condition: New.
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Condition: New.
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Condition: New.
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Condition: New.
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Counterfeit Integrated Circuits: Detection and Avoidance
Seller: Phatpocket Limited, Waltham Abbey, HERTS, United Kingdom
Seller rating 5 out of 5 stars
US$ 135.33
US$ 14.57 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketCondition: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.
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Condition: New.
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Test and Diagnosis for Small-Delay Defects (Paperback)
Language: English
Published by Springer-Verlag New York Inc., New York, 2014
ISBN 10: 1489989528 ISBN 13: 9781489989529
Paperback. Condition: new. Paperback. This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise. This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Introduction to Hardware Security and Trust (Paperback)
Language: English
Published by Springer-Verlag New York Inc., New York, 2014
ISBN 10: 1489990364 ISBN 13: 9781489990365
Paperback. Condition: new. Paperback. This book provides the foundations for understanding hardware security and trust, which have become major concerns for national security over the past decade. Coverage includes security and trust issues in all types of electronic devices and systems such as ASICs, COTS, FPGAs, microprocessors/DSPs, and embedded systems. This serves as an invaluable reference to the state-of-the-art research that is of critical significance to the security of, and trust in, modern societys microelectronic-supported infrastructures. This book provides the foundations for understanding hardware security and trust, which have become major concerns for national security over the past decade. Coverage includes security and trust issues in all types of electronic devices and systems such as ASICs, COTS, FPGAs, microprocessors/DSPs, and embedded systems. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Test and Diagnosis for Small-Delay Defects
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 143.69
US$ 20.53 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
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Introduction to Hardware Security and Trust
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 147.51
US$ 16.40 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Condition: As New. Unread book in perfect condition.
