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Mohammad Tehranipoor Peng Krishnendu Chakrabarty (21 results)
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Testing and Diagnosis for Small-Delay Defects.
Published by New York, Springer New York., 2011
ISBN 10: 1441982965 ISBN 13: 9781441982964
Language: English
Seller: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germany
Association Member: GIAQ ILAB VDA
Seller rating 5 out of 5 stars
US$ 19.06
Convert currencyUS$ 34.70 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketXVIII, 212 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Stamped. Sprache: Englisch.
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US$ 117.78
Convert currencyUS$ 2.64 shipping within U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
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US$ 116.44
Convert currencyUS$ 3.99 shipping within U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
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US$ 137.70
Convert currencyUS$ 2.64 shipping within U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
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Test and Diagnosis for Small-Delay Defects
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 126.63
Convert currencyUS$ 15.94 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Condition: New.
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US$ 136.75
Convert currencyUS$ 3.99 shipping within U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
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US$ 122.64
Convert currencyUS$ 20.61 shipping from United Kingdom to U.S.A.Quantity: 10 available
Add to basketPaperback. Condition: New.
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Test and Diagnosis for Small-Delay Defects
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 140.19
Convert currencyUS$ 19.96 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
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Test and Diagnosis for Small-Delay Defects
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 148.35
Convert currencyUS$ 19.96 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
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Condition: New. pp. 232.
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Test and Diagnosis for Small-Delay Defects
Published by Springer-Verlag New York Inc., 2014
ISBN 10: 1489989528 ISBN 13: 9781489989529
Language: English
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
US$ 180.37
Convert currencyUS$ 12.14 shipping from Ireland to U.S.A.Quantity: 15 available
Add to basketCondition: New. This book introduces new techniques for detecting and diagnosing small-delay defects in integrated circuits. It details effective and scalable methodologies for screening and diagnosing small-delay defects. Num Pages: 230 pages, 51 black & white tables, biography. BIC Classification: TDPB; TJFC; UYD. Category: (G) General (US: Trade). Dimension: 235 x 155 x 12. Weight in Grams: 361. . 2014. Paperback. . . . .
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Test and Diagnosis for Small-Delay Defects
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 176.51
Convert currencyUS$ 15.94 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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US$ 177.69
Convert currencyUS$ 33.26 shipping from United Kingdom to U.S.A.Quantity: 2 available
Add to basketHardcover. Condition: Brand New. 212 pages. 9.25x6.25x0.50 inches. In Stock.
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Test and Diagnosis for Small-Delay Defects
Published by Springer-Verlag New York Inc., 2014
ISBN 10: 1489989528 ISBN 13: 9781489989529
Language: English
Condition: New. This book introduces new techniques for detecting and diagnosing small-delay defects in integrated circuits. It details effective and scalable methodologies for screening and diagnosing small-delay defects. Num Pages: 230 pages, 51 black & white tables, biography. BIC Classification: TDPB; TJFC; UYD. Category: (G) General (US: Trade). Dimension: 235 x 155 x 12. Weight in Grams: 361. . 2014. Paperback. . . . . Books ship from the US and Ireland.
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US$ 205.54
Convert currencyUS$ 33.26 shipping from United Kingdom to U.S.A.Quantity: 1 available
Add to basketPaperback. Condition: Like New. Like New. book.
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Condition: As New. Unread book in perfect condition.
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US$ 107.21
Convert currencyUS$ 56.66 shipping from Germany to U.S.A.Quantity: Over 20 available
Add to basketGebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides an introduction to VLSI testing and diagnosis, with a focus on delay testing and small-delay defects Presents the most effective techniques for screening small-delay defects, such as long path-based, slack-based, critical fault-based, and.
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US$ 119.59
Convert currencyUS$ 56.66 shipping from Germany to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides an introduction to VLSI testing and diagnosis, with a focus on delay testing and small-delay defects Presents the most effective techniques for screening small-delay defects, such as long path-based, slack-based, critical fault-based, and.
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US$ 183.42
Convert currencyUS$ 8.65 shipping from United Kingdom to U.S.A.Quantity: 4 available
Add to basketCondition: New. Print on Demand pp. 232.
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US$ 196.58
Convert currencyUS$ 11.51 shipping from Germany to U.S.A.Quantity: 4 available
Add to basketCondition: New. PRINT ON DEMAND pp. 232.
