Murrer Robert Lee (1 results)
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Technologies for Synthetic Environments: Hardware-in-the-Loop Testing, Proceedings of, 9-11 April 1996; Orlando, Florida, SPIE.
Murrer, Robert Lee; DeCesaris, C.; Millner, P.; Cole Jr., J.S.; et.al.
Language: English
Published by SPIE PRESS-The International Society for Optical Engineering; Society of Photo Optical, Bellingham, WA, U.S.A., 1996
- Softcover
- First Edition
Seller: SUNSET BOOKS 2, Newark, OH, U.S.A.SUNSET BOOKS 2
Contact seller5-star sellerCondition: Used - Very good
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Paperback. Condition: Very Good. No Jacket. 1st. With/full markings and pocket. Light Wear, Soil. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Size: 4to. Ex-Library.