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Murt E M (17 results)
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murt e m
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Physical Measurement and Analysis of Thin Films
Published by Plenum Press, New York, NY, 1969
Seller: Book Bear, West Brookfield, MA, U.S.A.
Association Member: SNEAB
Seller rating 5 out of 5 stars
Cloth. Condition: Very Good. Dust Jacket Condition: No Dust Jacket. 194 pp. Tightly bound. Corners not bumped. Text is free of markings. Owner's name stamp on front end paper. Light foxing top fore-edge.
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US$ 7.37 10% off
US$ 6.64
US$ 19.15 shipping
Ships from France to U.S.A.Quantity: 1 available
Add to basketSoftcover. Condition: Bon. Ancien livre de bibliothèque. Couverture différente. Edition 1969. Tome 2. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Good. Former library book. Different cover. Edition 1969. Volume 2. Ammareal gives back up to 15% of this item's net price to charity organizations.
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Hardcover. Condition: Used: Very Good. 1st ed. Cloth, 194pp, vg. Progress In Analytical Chemistry, Volume 2.
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Physical Measurement and Analysis of Thin Films
Published by Plenum Publishing, 1969
Seller: George Cross Books, Lexington, MA, U.S.A.
Association Member: IOBA
Seller rating 4 out of 5 stars
Hardcover. First ition edition. Good/Good (23493) - Hardcover, good condition, w. ltly compressed spine. badly bumped r. top corner, 3 ltly bumped corners. Damp stain on r. brd. Creaky fr. hinge. Ltly tanned p. edges, eps. clean, tight, unmarked. Dj good, some lt soil, somewhat rubbed. Ltly tanned sp. damps stain, some lt edgwr. chip at top fr. 194.
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Physical Measurement and Analysis of Thin Films (Progress in Analytical Chemistry)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 69.58
US$ 16.05 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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US$ 65.84
US$ 20.75 shipping
Ships from United Kingdom to U.S.A.Quantity: 10 available
Add to basketPF. Condition: New.
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Condition: New. pp. 208.
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US$ 89.51
US$ 13.40 shipping
Ships from United Kingdom to U.S.A.Quantity: 2 available
Add to basketPaperback. Condition: Brand New. reprint edition. 205 pages. 9.01x5.98x0.44 inches. In Stock.
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Taschenbuch. Condition: Neu. Physical Measurement and Analysis of Thin Films | E. M. Murt | Taschenbuch | Progress in Analytical Chemistry | xi | Englisch | 2013 | Springer | EAN 9781489959126 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering.
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The Definitive Guide Hadoop YARN(Chinese Edition)
Language: Chinese
Published by Machinery Industry Press, 2015
ISBN 10: 7111491815 ISBN 13: 9787111491811
paperback. Condition: New. Language:Chinese.The Definitive Guide Hadoop YARN.
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Condition: new. Questo è un articolo print on demand.
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Condition: New. Print on Demand pp. 208 23:B&W 6 x 9 in or 229 x 152 mm Perfect Bound on White w/Gloss Lam.
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Physical Measurement and Analysis of Thin Films
Language: English
Published by Springer US, Springer US Dez 2013, 2013
ISBN 10: 1489959122 ISBN 13: 9781489959126
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware 208 pp. Englisch.
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Condition: New. PRINT ON DEMAND pp. 208.
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Springer Book Archives.
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Physical Measurement and Analysis of Thin Films
Language: English
Published by Springer, Springer Dez 2013, 2013
ISBN 10: 1489959122 ISBN 13: 9781489959126
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 208 pp. Englisch.
