Order Total (1 Item Items):
Shipping Destination:
Ness Stanley (20 results)
Skip to main search results
Search filters
Product Type
- All Product Types
- Books (19)
- Magazines & Periodicals (1)
- Comics (No further results match this refinement)
- Sheet Music (No further results match this refinement)
- Art, Prints & Posters (No further results match this refinement)
- Photographs (No further results match this refinement)
- Maps (No further results match this refinement)
- Manuscripts & Paper Collectibles (No further results match this refinement)
Condition Learn more
- New (13)
- As New, Fine or Near Fine (3)
- Very Good or Good (3)
- Fair or Poor (No further results match this refinement)
- As Described (1)
Binding
Collectible Attributes
- First Edition (1)
- Signed (No further results match this refinement)
- Dust Jacket (1)
- Seller-Supplied Images (8)
- Not Print on Demand (15)
Language (2)
Free Shipping
Seller Location
Seller Rating
-
-
Stress Analysis of Silicon Carbide Microelectromechanical Systems Using Raman Spectroscopy (Paperback or Softback)
Language: English
Published by Biblioscholar 10/26/2012, 2012
ISBN 10: 128686237X ISBN 13: 9781286862377
Paperback or Softback. Condition: New. Stress Analysis of Silicon Carbide Microelectromechanical Systems Using Raman Spectroscopy. Book.
-
Christopher Street: #225, May, 1995: Spring Fiction Issue
Published by That New Magazine, New York, 1995
Seller: Bolerium Books Inc., San Francisco, CA, U.S.A.
Seller rating 5 out of 5 stars
Magazine / Periodical First Edition
Magazine. 40p., 8.5x11 inches, articles, reviews, news, photos, illustrations, ads, light wear else good magazine in stapled pictorial wraps.
-
Stress Analysis of Silicon Carbide Microelectromechanical Systems Using Raman Spectroscopy
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 22.29
US$ 15.96 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
-
Stress Analysis of Silicon Carbide Microelectromechanical Systems Using Raman Spectroscopy
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 21.52
US$ 19.99 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
-
Visual and Optical Testing (Nondestructive Testing Handbook)
Language: English
Published by Amer Society for Nondestructive, 1993
ISBN 10: 0931403057 ISBN 13: 9780931403057
hardcover. Condition: Very Good. Connecting readers with great books since 1972! Used books may not include companion materials, and may have some shelf wear or limited writing. We ship orders daily and Customer Service is our top priority!
-
Condition: New. KlappentextrnrnDuring the fabrication of Micro-Electro-Mechanical Systems (MEMS), residual stress is often induced in the thin films that are deposited to create these systems. These stresses can cause the device to fail due to buckling, curling.
-
Visual and Optical Testing (Nondestructive Testing Handbook)
Language: English
Published by Amer Society for Nondestructive, 1993
ISBN 10: 0931403057 ISBN 13: 9780931403057
Hardcover. Condition: Good. Great shape hardback. Dust jacket is in nice shape with no rips or tears. Pages are clean and unmarked. Minor rubbing on upper edge of dust jacket. Tulsa's largest used bookstore. Located on South Mingo Road since 1991. No-hassle return policy if not completely satisfied.
-
Stress Analysis of Silicon Carbide Microelectromechanical Systems Using Raman Spectroscopy
Language: English
Published by Creative Media Partners, LLC, 2012
ISBN 10: 128686237X ISBN 13: 9781286862377
PAP. Condition: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
-
Stress Analysis of Silicon Carbide Microelectromechanical Systems Using Raman Spectroscopy
Language: English
Published by Creative Media Partners, LLC Okt 2012, 2012
ISBN 10: 128686237X ISBN 13: 9781286862377
Taschenbuch. Condition: Neu. Neuware - During the fabrication of Micro-Electro-Mechanical Systems (MEMS), residual stress is often induced in the thin films that are deposited to create these systems. These stresses can cause the device to fail due to buckling, curling, or fracture. Government and industry are looking for ways to characterize the stress during the deposition of thin films in order to reduce or eliminate device failure. Micro-Raman spectroscopy has been successfully used to analyze poly-silicon MEMS devices made with the Multi-User MEMS Process (MUMPS). Micro-Raman spectroscopy was selected because it is nondestructive, fast and has the potential for in situ stress monitoring. This research attempts to validate the use of Raman spectroscopy to analyze the stress in MEMS made of silicon carbide (SiC) using the Multi-User Silicon Carbide surface micromachining (MUSiC) process. Surface interferometry of fixed-fixed beam arrays and comb drive resonance test are employed to determine stress and compare it to the Raman values. Research also includes baseline spectra of 6H, 4H, and 15R poly-types of bulk SiC. Raman spectra of 1- to 2-µm thick 3C-SiC thin films deposited on silicon, silicon nitride, and silicon oxide substrates are presented as an attempt to establish a baseline spectra for 3C-SiC, the poly-type of SiC found in MEMS made with the MUSiC process.
-
Stress Analysis of Silicon Carbide Microelectromechanical Systems Using Raman Spectroscopy
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
US$ 21.53
US$ 5.54 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketPAP. Condition: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
-
Stress Analysis of Silicon Carbide Microelectromechanical Systems Using Raman Spectroscopy
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 127.64
US$ 19.99 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
-
US$ 116.67
US$ 33.31 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketpaperback. Condition: Like New. Like New. book.
-
Condition: As New. Unread book in perfect condition.
-
Visual and Optical Testing (Nondestructive Testing Handbook)
Language: English
Published by Amer Society for Nondestructive, 1993
ISBN 10: 0931403057 ISBN 13: 9780931403057
US$ 192.16
US$ 33.31 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketHardcover. Condition: Good. Good. Dust Jacket NOT present. CD WILL BE MISSING. . SHIPS FROM MULTIPLE LOCATIONS. book.
-
Nondestructive Testing Overview (Nondestructive Testing Handbook (2nd Ed.), V. 10.)
Language: English
Published by Amer Society for Nondestructive, 1996
ISBN 10: 1571170189 ISBN 13: 9781571170187
Condition: New. Satisfaction Guaranteed or your money back.
-
Nondestructive Testing Overview (Nondestructive Testing Handbook (2nd Ed.), V. 10.)
Language: English
Published by Amer Society for Nondestructive, 1996
ISBN 10: 1571170189 ISBN 13: 9781571170187
US$ 310.20
US$ 33.31 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to baskethardcover. Condition: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
-
Condition: New. Print on Demand pp. 122.
-
Condition: New. Print on Demand pp. 122.
-
Condition: New. PRINT ON DEMAND pp. 122.
