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Transistor Scaling: Volume 913: Methods, Materials and Modeling (MRS Proceedings)
Language: English
Published by Cambridge University Press, 2006
ISBN 10: 1558998691 ISBN 13: 9781558998698
Condition: New.
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Transistor Scaling: Volume 913: Methods, Materials and Modeling (MRS Proceedings)
Language: English
Published by Cambridge University Press, 2006
ISBN 10: 1558998691 ISBN 13: 9781558998698
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 55.16
US$ 16.22 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Transistor Scaling: Volume 913: Methods, Materials and Modeling (MRS Proceedings)
Language: English
Published by Cambridge University Press, 2006
ISBN 10: 1558998691 ISBN 13: 9781558998698
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
First Edition
Condition: New. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. Editor(s): Thompson, Scott; Nouri, Faran; Lee, Wen-Chin; Tsai, Wilman. Series: MRS Proceedings. Num Pages: 205 pages, Illustrations. BIC Classification: TGM; TJFD3. Category: (U) Tertiary Education (US: College). Dimension: 228 x 152 x 18. Weight in Grams: 432. . 2006. 1st Edition. hardcover. . . . .
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Transistor Scaling (Hardback or Cased Book)
Language: English
Published by Cambridge University Press 11/7/2006, 2006
ISBN 10: 1558998691 ISBN 13: 9781558998698
Hardback or Cased Book. Condition: New. Transistor Scaling. Book.
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Transistor Scaling
Language: English
Published by Materials Research Society, 2006
ISBN 10: 1558998691 ISBN 13: 9781558998698
Condition: New. pp. ix + 205.
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Transistor Scaling: Volume 913: Methods, Materials and Modeling (MRS Proceedings)
Language: English
Published by Cambridge University Press, 2006
ISBN 10: 1558998691 ISBN 13: 9781558998698
Condition: New. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. Editor(s): Thompson, Scott; Nouri, Faran; Lee, Wen-Chin; Tsai, Wilman. Series: MRS Proceedings. Num Pages: 205 pages, Illustrations. BIC Classification: TGM; TJFD3. Category: (U) Tertiary Education (US: College). Dimension: 228 x 152 x 18. Weight in Grams: 432. . 2006. 1st Edition. hardcover. . . . . Books ship from the US and Ireland.
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US$ 70.83
US$ 13.54 shipping
Ships from United Kingdom to U.S.A.Quantity: 2 available
Add to basketHardcover. Condition: Brand New. 205 pages. 9.00x6.00x0.56 inches. In Stock.
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Transistor Scaling
Language: English
Published by Cambridge University Press, 2006
ISBN 10: 1558998691 ISBN 13: 9781558998698
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - For the past four decades, geometric scaling of silicon CMOS transistors has enabled not only an exponential increase in circuit integration density - Moore's Law - but also a corresponding enhancement in the transistor performance. Simple MOSFET geometric scaling has driven the industry to date. However, as the transistor gate lengths drop below 35nm and the gate oxide thickness is reduced to 1nm, physical limitations such as off-state leakage current and power density make geometric scaling an increasingly challenging task. In order to continue CMOS device scaling, innovations in device structures and materials are required and the industry needs a new scaling vector. Starting at the 90 and 65nm technology generation, strained silicon has emerged as one such innovation. Other device structures such as multigate FETs may be introduced to meet the scaling challenge. This book shares results and physical models related to MOSFETs and to discuss innovative approaches necessary to continue the transistor scaling. Expanded versions of presentations in the areas of technology development are featured.
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Transistor Scaling: Volume 913: Methods, Materials and Modeling (MRS Proceedings)
Language: English
Published by Cambridge University Press, 2006
ISBN 10: 1558998691 ISBN 13: 9781558998698
US$ 119.93
US$ 33.85 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketHardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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US$ 51.53
US$ 13.54 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketHardcover. Condition: Brand New. 205 pages. 9.00x6.00x0.56 inches. In Stock. This item is printed on demand.
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Transistor Scaling: Volume 913: Methods, Materials and Modeling
Language: English
Published by Materials Research Society, 2006
ISBN 10: 1558998691 ISBN 13: 9781558998698
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
US$ 56.96
US$ 20.80 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketHardback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
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Transistor Scaling
Language: English
Published by Materials Research Society, 2006
ISBN 10: 1558998691 ISBN 13: 9781558998698
Condition: New. Print on Demand pp. ix + 205 Illus.
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Transistor Scaling
Language: English
Published by Materials Research Society, 2006
ISBN 10: 1558998691 ISBN 13: 9781558998698
Condition: New. PRINT ON DEMAND pp. ix + 205.
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Transistor Scaling
Language: English
Published by Cambridge University Press, 2006
ISBN 10: 1558998691 ISBN 13: 9781558998698
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This book shares results and physical models related to MOSFETs and to discuss innovative approaches necessary to continue the transis.
