Quinto Eric Todd Edt (10 results)

Proceedings of the International Conference on Sensing and Imaging, 2018
Quinto, Eric Todd (EDT); Ida, Nathan (EDT); Jiang, Ming (EDT); Louis, Alfred K. (EDT)
Language: English
Published by Springer, 2021
Series: Book 21 of 342 - Lecture Notes in Electrical Engineering
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
US$ 208.31
US$ 2.64 shippingShips within U.S.A.Quantity: 15 available
Condition: New.

Proceedings of the International Conference on Sensing and Imaging, 2018
Quinto, Eric Todd (EDT); Ida, Nathan (EDT); Jiang, Ming (EDT); Louis, Alfred K. (EDT)
Language: English
Published by Springer, 2019
Series: Book 21 of 342 - Lecture Notes in Electrical Engineering
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
US$ 208.64
US$ 2.64 shippingShips within U.S.A.Quantity: 15 available
Condition: New.

Proceedings of the International Conference on Sensing and Imaging, 2018
Quinto, Eric Todd (EDT); Ida, Nathan (EDT); Jiang, Ming (EDT); Louis, Alfred K. (EDT)
Language: English
Published by Springer, 2021
Series: Book 21 of 342 - Lecture Notes in Electrical Engineering
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
US$ 209.24
US$ 2.64 shippingShips within U.S.A.Quantity: 15 available
Condition: As New. Unread book in perfect condition.

Proceedings of the International Conference on Sensing and Imaging, 2018
Quinto, Eric Todd (EDT); Ida, Nathan (EDT); Jiang, Ming (EDT); Louis, Alfred K. (EDT)
Language: English
Published by Springer, 2019
Series: Book 21 of 342 - Lecture Notes in Electrical Engineering
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
US$ 209.69
US$ 2.64 shippingShips within U.S.A.Quantity: 15 available
Condition: As New. Unread book in perfect condition.

Microlocal Analysis and Inverse Problems in Tomography and Geometry
Quinto, Eric Todd (EDT); Stefanov, Plamen D. (EDT); Uhlmann, Gunther (EDT)
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
US$ 210.92
US$ 2.64 shippingShips within U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.

Microlocal Analysis and Inverse Problems in Tomography and Geometry
Quinto, Eric Todd (EDT); Stefanov, Plamen D. (EDT); Uhlmann, Gunther (EDT)
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
US$ 212.02
US$ 2.64 shippingShips within U.S.A.Quantity: Over 20 available
Condition: New.

Microlocal Analysis and Inverse Problems in Tomography and Geometry
Quinto, Eric Todd (EDT); Stefanov, Plamen D. (EDT); Uhlmann, Gunther (EDT)
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: New
US$ 211.85
US$ 20.07 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New.

Microlocal Analysis and Inverse Problems in Tomography and Geometry
Quinto, Eric Todd (EDT); Stefanov, Plamen D. (EDT); Uhlmann, Gunther (EDT)
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: Used - As new
US$ 224.72
US$ 20.07 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.

Proceedings of the International Conference on Sensing and Imaging : Chengdu University of Information Technology, Chengdu, Sichuan, China, on June 5-7, 2017
Jiang, Ming (EDT); Ida, Nathan (EDT); Louis, Alfred K. (EDT); Quinto, Eric Todd (EDT)
Language: English
Published by Springer, 2018
Series: Book 318 of 548 - Lecture Notes in Electrical Engineering
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
US$ 260.02
US$ 2.64 shippingShips within U.S.A.Quantity: 15 available
Condition: New.

Proceedings of the International Conference on Sensing and Imaging : Chengdu University of Information Technology, Chengdu, Sichuan, China, on June 5-7, 2017
Jiang, Ming (EDT); Ida, Nathan (EDT); Louis, Alfred K. (EDT); Quinto, Eric Todd (EDT)
Language: English
Published by Springer, 2018
Series: Book 318 of 548 - Lecture Notes in Electrical Engineering
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
US$ 273.31
US$ 2.64 shippingShips within U.S.A.Quantity: 15 available
Condition: As New. Unread book in perfect condition.