Rohit Singhal (8 results)

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    • Condition: Used - Very good

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      Hardcover. Condition: Very Good. This book is in very good condition; no remainder marks. Appears to have been gently used. Inside pages are clean. ; Computer Engineering Series; 6.75 X 0.97 X 9.47 inches; 386 pages.

    • Language: English

      Published by VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2009

      3639203666 / 9783639203660

      • Softcover

      Seller: Books Puddle, New York, NY, U.S.A.Books Puddle

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      Condition: New

      US$ 103.46

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      Condition: New. pp. 132.

    • Language: English

      Published by VDM Verlag Dr. Müller, 2009

      3639203666 / 9783639203660

      • Softcover

      Seller: preigu, Osnabrück, Germanypreigu

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      US$ 60.36

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      Taschenbuch. Condition: Neu. Data Integrity for On-Chip Interconnects | A Communication Theoretic Approach | Rohit Singhal | Taschenbuch | Englisch | VDM Verlag Dr. Müller | EAN 9783639203660 | Verantwortliche Person für die EU: VDM Verlag Dr. Müller, Brivibas Gatve 197, 1039 RIGA, LETTLAND, customerservice[at]vdm-vsg[dot]de | Anbieter: preigu.

    • Language: English

      Published by VDM Verlag, 2009

      3639203666 / 9783639203660

      • Softcover

      Seller: Mispah books, Redhill, SURRE, United KingdomMispah books

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      Condition: Used - As new

      US$ 159.89

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      Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

    • Language: English

      Published by VDM Verlag Dr. Müller, 2009

      3639203666 / 9783639203660

      • Softcover
      • Print on Demand

      Seller: moluna, Greven, Germanymoluna

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      US$ 54.72

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      Kartoniert / Broschiert. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Singhal RohitDr. Singhal is a Senior Design Engineer, at Integrated Device Technology Inc. Dr. Choi and Dr. Mahapatra are both Associate Professors at Texas A&M University. This work resulted from Dr. Singhal s doctoral research .

    • Language: English

      Published by VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2009

      3639203666 / 9783639203660

      • Softcover
      • Print on Demand

      Seller: Majestic Books, Hounslow, United KingdomMajestic Books

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      Condition: New

      US$ 104.66

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      Condition: New. Print on Demand pp. 132 2:B&W 6 x 9 in or 229 x 152 mm Perfect Bound on Creme w/Gloss Lam.

    • Language: English

      Published by VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2009

      3639203666 / 9783639203660

      • Softcover
      • Print on Demand

      Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios

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      Condition: New

      US$ 113.09

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      Condition: New. PRINT ON DEMAND pp. 132.

    • Language: English

      Published by VDM Verlag Dr. Müller, 2009

      3639203666 / 9783639203660

      • Softcover
      • Print on Demand

      Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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      Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The desire for having a smaller-faster chip that does more than ever before, has led to shrinking feature size and growing integration density. This integration has left designers grappling with increasing concerns of signal-integrity (SI), timing- closure and power-consumption. Firstly, the shrinking feature size has resulted in greater delays. Further, the adjacent wires are now very close and cause Cross-talk to each other's signals. Traditional designs focus on protecting SI on long parallel wires. The SI designs accomodate the worst case delays of signals; while they aim to improve the worst-case delays at a circuit level using novel tricks, they are transparent to the actual data carried in the wires. Departing from this trend, this work aims to introduce an information theoretic approach to address data-integrity (DI). A novel approach for evaluating the data carrying capacity of long parallel wires is presented herein. This capacity is much greater than the data-rate achieved by SI designs. This work also proposes several practical designs with data-rate approaching this capacity.