Ruhle Ernst (37 results)

Broschiert. Condition: Gut. 62 Seiten; Der Erhaltungszustand des hier angebotenen Werks ist trotz seiner Bibliotheksnutzung sauber. Es befindet sich lediglich ein Bibliotheksstempel im Heft; ordnungsgemäß entwidmet. Sprache: Englisch Gewicht in Gramm: 200.

OBroschur. Condition: Sehr gut. Premiere 30. September 1988. 36 unpag. S. mit Stab u. Besetzung, geheft. OBroschur, quer-8°. Mit 4 Zeichn. Barlachs u. 13 Probenfotos. Zahlr. Texte zu Stück, Autor u. Zeit. Dazu umfangr. Barlach-Chronik 1870 - 1938 (Elmar Jansen), mit 1 Portraitfoto. Gering berieben u. lichtrandig. Sehr gut. Broschüre.…

Broschiert. Condition: Gut. 274 Seiten; Das hier angebotene Buch stammt aus einer teilaufgelösten wissenschaftlichen Bibliothek und trägt die entsprechenden Kennzeichnungen (Rückenschild, Instituts-Stempel.). Schnitt und Einband sind etwas staubschmutzig; Einbandkanten leicht bestossen; Der Buchzustand ist ansonsten ordentlich und dem Alter entsprechend gut. Sprache: Deutsch Gewicht in Gramm: 380.…

No Binding. Condition: Fair. No Jacket. 1st. Wear, soil, bends, tears, small chips, stains, owner markings. Thank you for your purchase from Sunset Books! Help Promote World Literacy, GIVE a Book as a GIFT!! In stock, Ships from Ohio. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International Priority mail. WE COMBINE SHIPPING ON MULTIPLE PURCHASES!!!!SIZE is 10.5" W. (27 cm) x 13.375" H. (34 cm) Size: Folio Size: Folio - over 12 - 15" tall. Rühle, Richard (Deutscher Text); Reed Jr, Dave (Worte von) (illustrator). Sheet music.…

Condition: New.

Condition: As New. Unread book in perfect condition.

Hardcover. Condition: Very Good. xiv + 440 pp. Springer series in materials science, 50. Rubber-stamped on front free endpaper. book.

Condition: New.

Condition: As New. Unread book in perfect condition.

Softcover. 1... 166 Seiten Ungelesenes Buch. Sehr guter Zustand. Evtl. minimale Lagerspuren. 9783899365290 Sprache: Deutsch Gewicht in Gramm: 281.

Gebunden. Condition: Gut. Gebraucht - Gut Zustand: Gut, Mängelexemplar, XIV, 440 p. 211 illus., 32 in color About this book: This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students. Written for researchers.…

Condition: New.

Condition: New.

Condition: As New. Unread book in perfect condition.

Condition: New. In English.

Taschenbuch. Condition: Neu. High-Resolution Imaging and Spectrometry of Materials | Frank Ernst (u. a.) | Taschenbuch | Springer Series in Materials Science | xiv | Englisch | 2010 | Springer | EAN 9783642075254 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at 'critical' regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science.…

Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at 'critical' regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science.…

Condition: New. pp. xiv + 440.

hardcover. Condition: New. In shrink wrap. Looks like an interesting title.

Condition: gut. 2006. Telecommunications Markets in Central and South Eastern Europe: Market Developments and Regulatory Frameworks (Regulierungsrecht und Regulierungsökonomie) In deutscher Sprache. pages.

Hardcover. Condition: Brand New. 440 pages. 9.25x6.25x0.75 inches. In Stock.

Paperback. Condition: Brand New. reprint edition. 454 pages. 9.00x6.00x1.08 inches. In Stock.

Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

hardcover. Condition: New.

Pp. Condition: Gut. 1. Aufl. 712 S. : graph. Darst. ; 23 cm Das angebotene Buch stammt aus einer aufgelösten wissenschaftlichen Bibliothek und trägt die entsprechenden Kennzeichnungen (Rückenschild, Instituts-Stempel., selten auch Markierungen/Unterstreichungen vorhanden). Schnitt und Einband sind etwas staubschmutzig. Der Buchzustand ist ansonsten ordentlich und dem Alter entsprechend gut. R10-6 Sprache: Deutsch Gewicht in Gramm: 1001.…

Hardcover. Condition: Good. No Jacket. 1st. Three-Quarter Leather, marbled boards. 24/1326pp, missing spine cover, wear on edges, volume is 2-1/4" thick, 52 issues (heft), very interesting to leaf through, shows the electrical world and its state of art at that time, very unique, very rare, even rarer is that the papers are bound. In the German language. Some browning. Item is stamped "DANMARKS TEKNISKE BIBLIOTEK" on Title Page. I suspect it was acquired by the U.S. at the end of WWII from a captured German location, and then made its way to Wright-Patterson and into the Technical Library. Also my speculation, that the volume was taken from Denmark to Germany early in WWII. Pennsylvania RR Locomotive #3998 (2 electric motor drive) on page 241. NO Dust Jacket. Has or May Have all standard Library markings, pocket, labels, stamps, wear and soil to covers. CLEAN TEXT! The Copyright date is 1910 for this Printing. EXTRA MEDIA MAIL SHIPPING WOULD BE REQUIRED BUT WILL NOT BE COLLECTED AS $6.00 OF PRICE IS FOR EXTRA POSTAGE! So it will ship at the One Book rate. Please consider this when comparing pricing! Thank you for your purchase from Sunset Books! Help Promote World Literacy, GIVE a Book as a GIFT!! In stock, Ships from Ohio. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. WE COMBINE SHIPPING ON MULTIPLE PURCHASES!!!! SEE PICTURES!!!!! ANY ODD/GREEN TONES ON THE SCANS ARE CAUSED BY MY SCANNER!! All of our Technical/Textbook/Ex-Library volumes were obtained legally through Public or Auction sales. This volume was purchased through Public Government Auction as part of the books being disposed of by the Wright-Patterson AFB Technical Library, formerly known as Wright Field, Dayton, Ohio. Size: Folio Size: Folio - over 12 - 15" tall. Journal.…

Condition: new. Questo è un articolo print on demand.

Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at 'critical' regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science. 460 pp. Englisch.…

Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at 'critical' regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science. 456 pp. Englisch.…