Sclaroff Stan Edt (8 results)
Pattern Recognition and Information Forensics : Icpr 2020 International Workshops, Virtual Event, January 10-11, 2021, Proceedings
Del Bimbo, Alberto (EDT); Cucchiara, Rita (EDT); Sclaroff, Stan (EDT); Farinella, Giovanni Maria (EDT); Mei, Tao (EDT)
Language: English
Published by Springer, 2021
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
US$ 61.10
US$ 2.64 shippingShips within U.S.A.Quantity: Over 20 available
Condition: New.
Pattern Recognition and Information Forensics : Icpr 2020 International Workshops, Virtual Event, January 10-11, 2021, Proceedings
Del Bimbo, Alberto (EDT); Cucchiara, Rita (EDT); Sclaroff, Stan (EDT); Farinella, Giovanni Maria (EDT); Mei, Tao (EDT)
Language: English
Published by Springer, 2021
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
US$ 68.52
US$ 2.64 shippingShips within U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.
Pattern Recognition and Information Forensics : Icpr 2020 International Workshops, Virtual Event, January 10-11, 2021, Proceedings
Del Bimbo, Alberto (EDT); Cucchiara, Rita (EDT); Sclaroff, Stan (EDT); Farinella, Giovanni Maria (EDT); Mei, Tao (EDT)
Language: English
Published by Springer, 2021
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: New
US$ 68.81
US$ 19.86 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New.
Pattern Recognition and Information Forensics : Icpr 2020 International Workshops, Virtual Event, January 10-11, 2021, Proceedings
Del Bimbo, Alberto (EDT); Cucchiara, Rita (EDT); Sclaroff, Stan (EDT); Farinella, Giovanni Maria (EDT); Mei, Tao (EDT)
Language: English
Published by Springer, 2021
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: Used - As new
US$ 76.27
US$ 19.86 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.
Image Analysis and Processing ? Iciap 2022 : 21st International Conference, Lecce, Italy, May 23?27, 2022, Proceedings
Sclaroff, Stan (EDT); Distante, Cosimo (EDT); Leo, Marco (EDT); Farinella, Giovanni M. (EDT); Tombari, Federico (EDT)
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
US$ 104.67
US$ 2.64 shippingShips within U.S.A.Quantity: Over 20 available
Condition: New.
Image Analysis and Processing ? Iciap 2022 : 21st International Conference, Lecce, Italy, May 23?27, 2022, Proceedings
Sclaroff, Stan (EDT); Distante, Cosimo (EDT); Leo, Marco (EDT); Farinella, Giovanni M. (EDT); Tombari, Federico (EDT)
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
US$ 110.69
US$ 2.64 shippingShips within U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.
Image Analysis and Processing ? Iciap 2022 : 21st International Conference, Lecce, Italy, May 23?27, 2022, Proceedings
Sclaroff, Stan (EDT); Distante, Cosimo (EDT); Leo, Marco (EDT); Farinella, Giovanni M. (EDT); Tombari, Federico (EDT)
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: New
US$ 104.16
US$ 19.86 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New.
Image Analysis and Processing ? Iciap 2022 : 21st International Conference, Lecce, Italy, May 23?27, 2022, Proceedings
Sclaroff, Stan (EDT); Distante, Cosimo (EDT); Leo, Marco (EDT); Farinella, Giovanni M. (EDT); Tombari, Federico (EDT)
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: Used - As new
US$ 116.91
US$ 19.86 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.
