Sclaroff Stan Edt (8 results)
Pattern Recognition and Information Forensics : Icpr 2020 International Workshops, Virtual Event, January 10-11, 2021, Proceedings
Del Bimbo, Alberto (EDT); Cucchiara, Rita (EDT); Sclaroff, Stan (EDT); Farinella, Giovanni Maria (EDT); Mei, Tao (EDT)
Language: English
Published by Springer, 2021
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
US$ 61.78
US$ 2.64 shippingShips within U.S.A.Quantity: Over 20 available
Condition: New.
Pattern Recognition and Information Forensics : Icpr 2020 International Workshops, Virtual Event, January 10-11, 2021, Proceedings
Del Bimbo, Alberto (EDT); Cucchiara, Rita (EDT); Sclaroff, Stan (EDT); Farinella, Giovanni Maria (EDT); Mei, Tao (EDT)
Language: English
Published by Springer, 2021
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
US$ 68.52
US$ 2.64 shippingShips within U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.
Pattern Recognition and Information Forensics : Icpr 2020 International Workshops, Virtual Event, January 10-11, 2021, Proceedings
Del Bimbo, Alberto (EDT); Cucchiara, Rita (EDT); Sclaroff, Stan (EDT); Farinella, Giovanni Maria (EDT); Mei, Tao (EDT)
Language: English
Published by Springer, 2021
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: New
US$ 70.32
US$ 20.29 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New.
Pattern Recognition and Information Forensics : Icpr 2020 International Workshops, Virtual Event, January 10-11, 2021, Proceedings
Del Bimbo, Alberto (EDT); Cucchiara, Rita (EDT); Sclaroff, Stan (EDT); Farinella, Giovanni Maria (EDT); Mei, Tao (EDT)
Language: English
Published by Springer, 2021
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: Used - As new
US$ 77.90
US$ 20.29 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.
Image Analysis and Processing ? Iciap 2022 : 21st International Conference, Lecce, Italy, May 23?27, 2022, Proceedings
Sclaroff, Stan (EDT); Distante, Cosimo (EDT); Leo, Marco (EDT); Farinella, Giovanni M. (EDT); Tombari, Federico (EDT)
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
US$ 114.58
US$ 2.64 shippingShips within U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.
Image Analysis and Processing ? Iciap 2022 : 21st International Conference, Lecce, Italy, May 23?27, 2022, Proceedings
Sclaroff, Stan (EDT); Distante, Cosimo (EDT); Leo, Marco (EDT); Farinella, Giovanni M. (EDT); Tombari, Federico (EDT)
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
US$ 119.59
US$ 2.64 shippingShips within U.S.A.Quantity: Over 20 available
Condition: New.
Image Analysis and Processing ? Iciap 2022 : 21st International Conference, Lecce, Italy, May 23?27, 2022, Proceedings
Sclaroff, Stan (EDT); Distante, Cosimo (EDT); Leo, Marco (EDT); Farinella, Giovanni M. (EDT); Tombari, Federico (EDT)
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: New
US$ 106.44
US$ 20.29 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New.
Image Analysis and Processing ? Iciap 2022 : 21st International Conference, Lecce, Italy, May 23?27, 2022, Proceedings
Sclaroff, Stan (EDT); Distante, Cosimo (EDT); Leo, Marco (EDT); Farinella, Giovanni M. (EDT); Tombari, Federico (EDT)
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: Used - As new
US$ 119.40
US$ 20.29 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.
