Smith Deane S (23 results)
- Softcover
Seller: BargainBookStores, Grand Rapids, MI, U.S.A.BargainBookStores
Contact seller5-star sellerCondition: New
US$ 23.68
Free ShippingShips within U.S.A.Quantity: 5 available
Condition: New. Criss-cross Vacation (Paperback or Softback).
Published by Reserve Bank of New Zealand 1983, 1983
- Hardcover
Seller: Hard to Find Books NZ (Internet) Ltd., Dunedin, OTAGO, New ZealandHard to Find Books NZ (Internet) Ltd.
Contact seller5-star sellerAssociation member: IOBA
Condition: Used
US$ 9.53
US$ 24.19 shippingShips from New Zealand to U.S.A.Quantity: 1 available
Add to basketSuper octavo, hardcover (VG+) in d/w (VG); all our specials have minimal description to keep listing them viable. They are at least reading copies, complete and in reasonable condition, but usually secondhand; frequently they are superior examples. Ordering more than one book will reduce your overall postage costs.…
Published by Reserve Bank of NZ, 1983. Second edition., 1983
- Hardcover
Seller: The Book Firm, Subiaco, WA, AustraliaThe Book Firm
Contact seller3-star sellerCondition: Used
US$ 39.53
US$ 14.00 shippingShips from Australia to U.S.A.Quantity: 1 available
Add to basketHardcover. A touch of sunning to spine of dj, o/wise good condition. A collection of papers examining the nature of the various bank and non-bank financial institutions, reviewing financial developments, how the financial system works, monetary policy etc. 423pp. 11445.
Published by Reserve Bank of New Zealand, Wellington, 1983
- Hardcover
Seller: Book Express (NZ), Shannon, New ZealandBook Express (NZ)
Contact seller3-star sellerCondition: Used - Very good
US$ 7.51
US$ 45.00 shippingShips from New Zealand to U.S.A.Quantity: 3 available
Add to basketHardcover. Condition: Very Good. 423 pages.
Advances in X-Ray Analysis
Barrett, C. S. (EDT); Gilfrich, John V. (EDT); Huang, Ting C. (EDT); Jenkins, Ron (EDT); Mccarthy, G. J. (EDT)
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
US$ 83.69
US$ 2.64 shippingShips within U.S.A.Quantity: 15 available
Condition: New.
Advances in X-Ray Analysis
Barrett, C. S. (EDT); Gilfrich, John V. (EDT); Huang, Ting C. (EDT); Jenkins, Ron (EDT); Mccarthy, G. J. (EDT)
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
US$ 86.90
US$ 2.64 shippingShips within U.S.A.Quantity: 15 available
Condition: As New. Unread book in perfect condition.
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
US$ 76.24
US$ 19.77 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In English.
Journals of the Rev. T. Smith and the Rev. S. Deane, pastors of the first church in Portland, with notes and biographical notices and a summary history of Portland, by W. Willis. [Second edition.]
Smith, Thomas Pastor of the First Church in Portland U. S.|Deane, Samuel
Language: English
Published by British Library, Historical Print Editions, 2011
- Softcover
Seller: moluna, Greven, Germanymoluna
Contact seller5-star sellerCondition: New
US$ 41.50
US$ 54.84 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Condition: New. KlappentextbTitle:/b Journals of the Rev. T. Smith and the Rev. S. Deane, pastors of the first church in Portland, with notes and biographical notices and a summary history of Portland, by W. Willis. [Second edition.]br/br/bPublisher:/b .
- Softcover
Seller: Books Puddle, Woodside, NY, U.S.A.Books Puddle
Contact seller4-star sellerCondition: New
US$ 105.44
US$ 3.99 shippingShips within U.S.A.Quantity: 4 available
Condition: New. pp. 648.
- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
Contact seller5-star sellerCondition: New
US$ 76.56
US$ 47.80 shippingShips from Germany to U.S.A.Quantity: 1 available
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index. …
Published by Reserve Bank of New Zealand, Wellington, NZ, 1983
- Hardcover
Seller: J. Wyatt Books, Ottawa, ON, CanadaJ. Wyatt Books
Contact seller5-star sellerCondition: Used - Fine
US$ 46.00
US$ 23.00 shippingShips from Canada to U.S.A.Quantity: 1 available
Add to basketCloth. Condition: Fine. Dust Jacket Condition: Very Good. 2nd Edition. A range of articles in one volume, 423pp, F/VG. Book.
More images- Softcover
Seller: preigu, Osnabrück, Germanypreigu
Contact seller5-star sellerCondition: New
US$ 58.17
US$ 78.36 shippingShips from Germany to U.S.A.Quantity: 5 available
Taschenbuch. Condition: Neu. Advances in X-Ray Analysis | Volume 35B | C. S. Barrett (u. a.) | Taschenbuch | iv | Englisch | 2012 | Springer | EAN 9781461365327 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…
Condition: New
US$ 120.45
US$ 54.84 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Gebunden. Condition: New. Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrument.
- Hardcover
Seller: Chiron Media, Wallingford, United KingdomChiron Media
Contact seller5-star sellerCondition: New
US$ 325.58
US$ 20.49 shippingShips from United Kingdom to U.S.A.Quantity: 5 available
Hardcover. Condition: New.
Published by Springer, 1992
Seller: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.Zubal-Books, Since 1961
Contact seller5-star sellerCondition: Good. 2 Volumes, 1334 pp., hardcover, ex library, else text and bindings clean and tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.…
- Softcover
- Print on Demand
Seller: Brook Bookstore On Demand, Napoli, NA, ItalyBrook Bookstore On Demand
Contact seller5-star sellerCondition: New
US$ 53.30
US$ 12.31 shippingShips from Italy to U.S.A.Quantity: Over 20 available
Condition: new. Questo è un articolo print on demand.
- Softcover
- Print on Demand
Seller: Chiron Media, Wallingford, United KingdomChiron Media
Contact seller5-star sellerCondition: New
US$ 65.66
US$ 13.22 shippingShips from United Kingdom to U.S.A.Quantity: 20 available
PF. Condition: New. This item is printed on demand. Brand new book, sourced directly from publisher. Dispatch time is 6-7 days from our warehouse. Book will be sent in robust, secure packaging to ensure it reaches you securely.
- Softcover
- Print on Demand
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.
Contact seller5-star sellerCondition: New
US$ 61.67
US$ 25.75 shippingShips from Germany to U.S.A.Quantity: 2 available
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index. 648 pp. Englisch.…
- Softcover
- Print on Demand
Seller: THE SAINT BOOKSTORE, Southport, United KingdomTHE SAINT BOOKSTORE
Contact seller5-star sellerCondition: New
US$ 79.23
US$ 28.07 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Paperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
- Softcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
Contact seller5-star sellerCondition: New
US$ 55.77
US$ 54.84 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrum. …
- Softcover
- Print on Demand
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
Contact seller4-star sellerCondition: New
US$ 103.82
US$ 8.60 shippingShips from United Kingdom to U.S.A.Quantity: 4 available
Condition: New. Print on Demand pp. 648 67:B&W 6.69 x 9.61 in or 244 x 170 mm (Pinched Crown) Perfect Bound on White w/Gloss Lam.
- Softcover
- Print on Demand
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
Contact seller4-star sellerCondition: New
US$ 111.91
US$ 11.14 shippingShips from Germany to U.S.A.Quantity: 4 available
Condition: New. PRINT ON DEMAND pp. 648.
- Softcover
- Print on Demand
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000
Contact seller5-star sellerCondition: New
US$ 61.67
US$ 67.17 shippingShips from Germany to U.S.A.Quantity: 1 available
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 648 pp. Englisch.…
