Stein Alfred Editor (4 results)
Quality Aspects in Spatial Data Mining
Stein, Alfred (Editor)/ Shi, Wenzhong (Editor)/ Bijker, Wietske (Editor)
- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
Contact seller5-star sellerCondition: New
US$ 142.16
US$ 26.37 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Paperback. Condition: Brand New. 364 pages. 9.00x6.00x0.75 inches. In Stock.
More images- Softcover
- Signed
Seller: Pistil Books Online, IOBA, Seattle, WA, U.S.A.Pistil Books Online, IOBA
Contact seller5-star sellerAssociation member: IOBA
Condition: Used - Very good
US$ 201.25
US$ 6.00 shippingShips within U.S.A.Quantity: 1 available
Oversize Paperback. Condition: Very Good. Signed by Edward T. Stein, editor. 229 pages. 8 3/8"w x 10 3/4"h. Signed by Editor.
Language: English
Published by Kluwer Academic Pub 2002
Series: Remote Sensing and Digital Image Processing, Book 2 of 18. Book 2 of 18 - Remote Sensing and Digital Image Processing
- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
Contact seller5-star sellerCondition: New
US$ 270.25
US$ 16.48 shippingShips from United Kingdom to U.S.A.Quantity: 2 available
Paperback. Condition: Brand New. 300 pages. 9.25x6.25x0.75 inches. In Stock.
- Hardcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
Contact seller5-star sellerCondition: New
US$ 636.66
US$ 16.48 shippingShips from United Kingdom to U.S.A.Quantity: 2 available
Hardcover. Condition: Brand New. 1st edition. 404 pages. 9.50x6.50x1.25 inches. In Stock.
