Tille Daniel (4 results)
Test Pattern Generation using Boolean Proof Engines
Drechsler, Rolf; Eggersglüß, Stephan; Fey, Görschwin; Tille, Daniel
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
US$ 128.97
US$ 16.35 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In.
Test Pattern Generation using Boolean Proof Engines
Drechsler, Rolf; Eggersglüß, Stephan; Fey, Görschwin; Tille, Daniel
- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
US$ 136.18
US$ 16.35 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In.
Test Pattern Generation using Boolean Proof Engines
Rolf Drechsler|Stephan Eggersglüß|Görschwin Fey|Daniel Tille
- Softcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
Contact seller5-star sellerCondition: New
US$ 110.95
US$ 57.19 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Kartoniert / Broschiert. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The first book giving a detailed overview on SAT-based ATPGAll techniques are validated on industrial designsA comprehensive introduction to Boolean Satisfiability1 Introduction. 2 Preliminari…es. 2.1 Circuits. 2.2 Fault Models. 2.3 .
Test Pattern Generation using Boolean Proof Engines
Rolf Drechsler|Stephan Eggersglüß|Görschwin Fey|Daniel Tille
- Hardcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
Contact seller5-star sellerCondition: New
US$ 111.83
US$ 57.19 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The first book giving a detailed overview on SAT-based ATPGAll techniques are validated on industrial designsA comprehensive introduction to Boolean Satisfiability1 Introduction. 2 Preliminaries. 2.1 Circuit…s. 2.2 Fault Models. 2.3 .
