Tran Duc Tan (92 results)
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Published by CRC Press -, 2024
- Softcover
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Privacy Vulnerabilities and Data Security Challenges in the Iot
Agarwal, Shivani (EDT); Makkar, Sandhya (EDT); Tran, Duc-tan (EDT)
Language: English
Published by CRC Press, 2024
- Softcover
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Privacy Vulnerabilities and Data Security Challenges in the Iot
Agarwal, Shivani (EDT); Makkar, Sandhya (EDT); Tran, Duc-tan (EDT)
Language: English
Published by CRC Press, 2024
- Softcover
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- Softcover
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Diploma Thesis from the year 2005 in the subject Electrotechnology, grade: Master 9.8/10, , 28 entries in the bibliography, language: English, abstract: Microelectromechanical systems (MEMS) are collection of microsensors and actuators that have the ability to sense its environment and react to changes in that environment with the use of a microcircuit control. They also include the conventional microelectronics packaging, integrating antenna structures for command signals into microelectromechanical structures for desired sensing and actuating functions. The system may also need micropower supply, microrelay, and microsignal processing units. Microcomponents make the system faster, more reliable, cheaper, and capable of incorporating more complex functions. In the beginning of 1990s, MEMS appeared with the aid of the development of integrated circuit fabrication processes, in which sensors, actuators, and control functions are co-fabricated in silicon [1]. Since then, remarkable research progresses have been achieved in MEMS under the strong promotions from both government and industries. In addition to the commercialization of some less integrated MEMS devices, such as microaccelerometers, inkjet printer head, micromirrors for projection, etc., the concepts and feasibility of more complex MEMS devices have been proposed and demonstrated for the applications in such varied fields as microfluidics, aerospace, biomedical, chemical analysis, wireless communications, data storage, display, optics, etc. Some branches of MEMS, appearing as microoptoelectromechanical systems (MOEMS), micro total analysis systems, etc., have attracted a great research since their potential applications' market.…
Privacy Vulnerabilities and Data Security Challenges in the Iot
Agarwal, Shivani (EDT); Makkar, Sandhya (EDT); Tran, Duc-tan (EDT)
Language: English
Published by CRC Press, 2024
- Softcover
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Language: English
Published by CRC Press, 2024
- Softcover
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Language: English
Published by CRC Press, 2024
- Softcover
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Condition: New. 1st edition NO-PA16APR2015-KAP.
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Published by Taylor & Francis Ltd, 2024
- Softcover
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Published by CRC Press, 2024
- Softcover
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Privacy Vulnerabilities and Data Security Challenges in the Iot
Agarwal, Shivani (EDT); Makkar, Sandhya (EDT); Tran, Duc-tan (EDT)
Language: English
Published by CRC Press, 2024
- Softcover
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Published by CRC Press, 2024
- Softcover
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
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Language: English
Published by CRC Press, 2024
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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Language: English
Published by Springer, 2022
Series: Book 203 of 391 - Lecture Notes in Networks and Systems
- Softcover
Seller: Books From California, Simi Valley, CA, U.S.A.Books From California
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paperback. Condition: Very Good.
- Softcover
Seller: preigu, Osnabrück, Germanypreigu
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Taschenbuch. Condition: Neu. Design and Fabrication of a 3-DOF Piezoresistive Micro Accelerometer | A Completed Work from Design, Simulation, Fabrication to Performance Analysis | Tan Tran-Duc | Taschenbuch | 128 S. | Englisch | 2012 | LAP LAMBERT Academic Publishing | EAN 9783848447435 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.…
Privacy Vulnerabilities and Data Security Challenges in the Iot
Agarwal, Shivani (Editor)/ Makkar, Sandhya (Editor)/ Tran, Duc-tan (Editor)
Language: English
Published by CRC Pr I Llc, 2024
- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
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Paperback. Condition: Brand New. 234 pages. 9.18x6.12x9.21 inches. In Stock.
Language: English
Published by Springer, 2021
Series: Book 203 of 391 - Lecture Notes in Networks and Systems
- Hardcover
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Icrrm 2019 ? System Reliability, Quality Control, Safety, Maintenance and Management : Applications to Civil, Mechanical and Chemical Engineering
Gunjan, Vinit Kumar (EDT); Singh, Sri Niwas (EDT); Duc-tan, Tran (EDT); Aponte, Gloria Jeanette Rincon (EDT); Kumar, Amit (EDT)
- Softcover
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Intelligent Systems and Networks : Selected Articles from Icisn 2021, Vietnam
Tran, Duc-tan (EDT); Jeon, Gwanggil (EDT); Nguyen, Thi Dieu Linh (EDT); Lu, Joan (EDT); Xuan, Thu-do (EDT)
Language: English
Published by Springer, 2022
Series: Book 203 of 391 - Lecture Notes in Networks and Systems
- Softcover
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Language: English
Published by Springer, 2022
Series: Book 203 of 391 - Lecture Notes in Networks and Systems
- Softcover
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Intelligent Systems and Networks : Selected Articles from Icisn 2021, Vietnam
Tran, Duc-tan (EDT); Jeon, Gwanggil (EDT); Nguyen, Thi Dieu Linh (EDT); Lu, Joan (EDT); Xuan, Thu-do (EDT)
Language: English
Published by Springer, 2022
Series: Book 203 of 391 - Lecture Notes in Networks and Systems
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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Condition: New. In English.
Language: English
Published by CRC Press 2020-10-28, 2020
- Hardcover
Seller: Chiron Media, Wallingford, United KingdomChiron Media
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Hardcover. Condition: New. Brand new book, sourced directly from publisher. Dispatch time is 7-8 days from our warehouse. Book will be sent in robust, secure packaging to ensure it reaches you securely.
Intelligent Systems and Networks : Selected Articles from Icisn 2021, Vietnam
Tran, Duc-tan (EDT); Jeon, Gwanggil (EDT); Nguyen, Thi Dieu Linh (EDT); Lu, Joan (EDT); Xuan, Thu-do (EDT)
Language: English
Published by Springer, 2022
Series: Book 203 of 391 - Lecture Notes in Networks and Systems
- Softcover
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Privacy Vulnerabilities and Data Security Challenges in the IoT
Agarwal, Shivani (EDT); Makkar, Sandhya (EDT); Tran, Duc-tan (EDT)
Language: English
Published by CRC Press, 2020
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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Icrrm 2019 ? System Reliability, Quality Control, Safety, Maintenance and Management : Applications to Civil, Mechanical and Chemical Engineering
Gunjan, Vinit Kumar (EDT); Singh, Sri Niwas (EDT); Duc-tan, Tran (EDT); Aponte, Gloria Jeanette Rincon (EDT); Kumar, Amit (EDT)
- Softcover
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Privacy Vulnerabilities and Data Security Challenges in the IoT
Agarwal, Shivani (EDT); Makkar, Sandhya (EDT); Tran, Duc-tan (EDT)
Language: English
Published by CRC Press, 2020
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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US$ 221.37
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Condition: New.
Language: English
Published by Springer, 2022
Series: Book 203 of 391 - Lecture Notes in Networks and Systems
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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Condition: New. In English.
Privacy Vulnerabilities and Data Security Challenges in the IoT
Agarwal, Shivani (EDT); Makkar, Sandhya (EDT); Tran, Duc-tan (EDT)
Language: English
Published by CRC Press, 2020
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Content of this proceedings discusses emerging trends in structural reliability, safety and disaster management, covering topics like total quality management, risk maintenance and design for reliability. Some papers also address chemical process reliability, reliability analysis and engineering applications in chemical process equipment systems and includes a chapter on reliability evaluation models of chemical systems. Accepted papers from 2019 International Conference on Reliability, Risk Maintenance and Engineering Management (ICRRM 2019) are part of this conference proceeding. It offers useful insights to road safety engineers, disaster management professionals involved in product design and probabilistic methods in manufacturing systems.…
