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Ullrich Pietsch (41 results)
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US$ 25.83
Convert currencyUS$ 18.51 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketHardcover. 2nd ed. XVI, 408 Ex-library with stamp and library-signature. GOOD condition, some traces of use. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. C-05638 9780387400921 Sprache: Englisch Gewicht in Gramm: 550.
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US$ 52.17
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Add to baskethardcover. Condition: Very Good. High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures (Advanced Texts in Physics) This book is in very good condition and will be shipped within 24 hours of ordering. The cover may have some limited signs of wear but the pages are clean, intact and the spine remains undamaged. This book has clearly been well maintained and looked after thus far. Money back guarantee if you are not satisfied. See all our books here, order more than 1 book and get discounted shipping. .
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US$ 52.17
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Add to baskethardcover. Condition: Very Good. Shipped within 24 hours from our UK warehouse. Clean, undamaged book with no damage to pages and minimal wear to the cover. Spine still tight, in very good condition. Remember if you are not happy, you are covered by our 100% money back guarantee.
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US$ 11.44
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Add to basketGebundene Ausgabe. Condition: Gut. 96 Seiten, bebildert. Einband leicht berieben, ansonsten gut erhalten. ISBN: 9783000084423 Sprache: Deutsch Gewicht in Gramm: 550.
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US$ 26.04
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Add to basketHardcover. Ex-library with stamp and library-signature. GOOD condition, some traces of use. C-02760 9783540620297 Sprache: Englisch Gewicht in Gramm: 1050.
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High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 62.65
Convert currencyUS$ 15.97 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In English.
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Neuerwerbungen 1974-1979.
Published by Museum für Kunst- und Kulturgeschichte, Lübeck, 1980
Language: German
US$ 10.72
Convert currencyUS$ 23.13 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketkartonierte Ausgabe. Condition: Gut. 101 Seiten, schwarz-weiße Abbildungen, Inhaltsverzeichnis, abgekürzt zitierte Literatur, illustrierter Einband Dieser Auswahlkatalog erschien anläßlich der Ausstellung "Neuerwerbungen 1974-1979" im Museum Behnhaus vom 13. Juni bis 20. Juli 1980. Sprache: Deutsch Gewicht in Gramm: 200.
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US$ 51.48
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Add to basketHardcover. Condition: Very Good. 2. Auflage. Unread, some shelfwear. Immediately dispatched from Germany.
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Hardcover. Condition: new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks.
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HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.
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High-Resolution X-Ray Scattering
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
US$ 86.62
Convert currencyUS$ 7.83 shipping from United Kingdom to U.S.A.Quantity: 1 available
Add to basketHRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.
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Condition: New.
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US$ 106.55
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Add to basketCondition: New.
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High-Resolution X-Ray Scattering : From Thin Films to Lateral Nanostructures
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 96.77
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High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures (Advanced Texts in Physics)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 108.66
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US$ 105.53
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Add to basketHardcover. Condition: New.
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Condition: New.
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US$ 108.79
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Add to basketPF. Condition: New.
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Condition: As New. Unread book in perfect condition.
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hardcover. Condition: New. In shrink wrap. Looks like an interesting title!
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Condition: New. pp. 428.
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US$ 148.22
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High-Resolution X-Ray Scattering (Hardcover)
Published by Springer-Verlag New York Inc., New York, NY, 2004
ISBN 10: 0387400923 ISBN 13: 9780387400921
Language: English
Hardcover. Condition: new. Hardcover. The book presents a detailed description of high-resolution x-ray scattering methods suitable for the investigation of the real structure of single-crystalline layers and multilayers, including structure defects in the layers and at the interfaces. Particular attention is devoted to lateral structures in semiconductors and semiconductor multilayers such as quantum wires and quantum dots. Both the theoretical background and the application of the methods are discussed. The second edition is extended to deal with lateral surface nanostructures such as gratings and dots, new examples for measuring layer thickness, lattice mismatch, and surface/interface roughness. The book will be an invaluable source for graduates and scientists. During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures (Advanced Texts in Physics)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 162.62
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Add to basketCondition: New. In.
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High-Resolution X-Ray Scattering
Published by Springer New York, Springer US Dez 2011, 2011
ISBN 10: 1441923071 ISBN 13: 9781441923073
Language: English
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
US$ 114.71
Convert currencyUS$ 69.40 shipping from Germany to U.S.A.Quantity: 2 available
Add to basketTaschenbuch. Condition: Neu. Neuware -During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 428 pp. Englisch.
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High-Resolution X-Ray Scattering : From Thin Films to Lateral Nanostructures
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 170.27
Convert currencyUS$ 20.00 shipping from United Kingdom to U.S.A.Quantity: 1 available
Add to basketCondition: As New. Unread book in perfect condition.
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US$ 159.30
Convert currencyUS$ 33.33 shipping from United Kingdom to U.S.A.Quantity: 1 available
Add to basketHardcover. Condition: Like New. Like New. book.
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High-Resolution X-Ray Scattering : From Thin Films to Lateral Nanostructures
Published by Springer New York, Springer US, 2011
ISBN 10: 1441923071 ISBN 13: 9781441923073
Language: English
US$ 120.25
Convert currencyUS$ 73.13 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketTaschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.
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US$ 163.80
Convert currencyUS$ 33.33 shipping from United Kingdom to U.S.A.Quantity: 2 available
Add to basketPaperback. Condition: Brand New. 2nd edition. 410 pages. 9.00x6.00x1.00 inches. In Stock.
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Condition: As New. Unread book in perfect condition.
