Virazel Arnaud (11 results)
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
US$ 110.84
US$ 15.81 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In.
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
US$ 131.72
US$ 15.81 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In.
Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
US$ 144.87
US$ 2.64 shippingShips within U.S.A.Quantity: Over 20 available
Condition: New.
Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: New
US$ 131.71
US$ 19.80 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New.
Advanced Test Methods for SRAMs: Effective Solutions for.
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Softcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
Contact seller4-star sellerCondition: New
US$ 166.52
US$ 3.99 shippingShips within U.S.A.Quantity: 4 available
Condition: New. pp. 188.
Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: Used - As new
US$ 197.12
US$ 19.80 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.
Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
US$ 216.60
US$ 2.64 shippingShips within U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.
Advanced Test Methods for SRAMs
Alberto Bosio|Luigi Dilillo|Patrick Girard|Serge Pravossoudovitch|Arnaud Virazel
- Softcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
Contact seller5-star sellerCondition: New
US$ 108.40
US$ 55.81 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book to present complete, state-of-the-art coverage of dynamic fault memory testingPresents content using a bottom-up approach, from the electrical causes of malfunction up to the generation of smart test strate…giesIncludes case stu.
Advanced Test Methods for SRAMs
Alberto Bosio|Luigi Dilillo|Patrick Girard|Serge Pravossoudovitch|Arnaud Virazel
- Hardcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
Contact seller5-star sellerCondition: New
US$ 109.12
US$ 55.81 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book to present complete, state-of-the-art coverage of dynamic fault memory testingPresents content using a bottom-up approach, from the electrical causes of malfunction up to the generation of smart t…est strategiesIncludes case stu.
Advanced Test Methods for SRAMs: Effective Solutions for.
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Softcover
- Print on Demand
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
Contact seller4-star sellerCondition: New
US$ 174.61
US$ 8.58 shippingShips from United Kingdom to U.S.A.Quantity: 4 available
Condition: New. Print on Demand pp. 188.
Advanced Test Methods for SRAMs: Effective Solutions for.
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Softcover
- Print on Demand
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
Contact seller4-star sellerCondition: New
US$ 184.01
US$ 11.33 shippingShips from Germany to U.S.A.Quantity: 4 available
Condition: New. PRINT ON DEMAND pp. 188.
