Isbn: 9781441923066 - Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (12 results)

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  • Language: English

    Published by Springer, 2010

    1441923063 / 9781441923066

    • Softcover

    Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections

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    Condition: New. In English.

  • Language: English

    Published by Springer, 2010

    1441923063 / 9781441923066

    • Softcover

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    Condition: New. pp. 296.

  • Language: English

    Published by Springer, 2010

    1441923063 / 9781441923066

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    Taschenbuch. Condition: Neu. Scanning Probe Microscopy | Atomic Scale Engineering by Forces and Currents | Adam Foster (u. a.) | Taschenbuch | xiv | Englisch | 2010 | Springer | EAN 9781441923066 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

  • Language: English

    Published by Springer, 2006

    1441923063 / 9781441923066

    • Softcover

    Seller: Revaluation Books, Exeter, United KingdomRevaluation Books

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    Paperback. Condition: Brand New. 281 pages. 9.00x6.00x0.70 inches. In Stock.

  • Language: English

    Published by Springer, 2010

    1441923063 / 9781441923066

    • Softcover

    Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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    Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today's simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the materials properties influence the instrument's operation, and theorists will understand how simulations can be directly compared to experimental data.Key FeaturesServes as a comprehensive source of information for researchers, teachers, and students about the theory underlying the rapidly expanding field of scanning probe microscopyProvides a framework for linking scanning probe theory and simulations with experimental dataWritten in the style of a textbook with step-by-step examples of how theoretical concepts are used to generate state-of-the-art simulations.

  • Language: English

    Published by Springer, 2010

    1441923063 / 9781441923066

    • Softcover

    Seller: Mispah books, Redhill, SURRE, United KingdomMispah books

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  • Language: English

    Published by Springer, 2010

    1441923063 / 9781441923066

    • Softcover
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    Seller: Brook Bookstore On Demand, Napoli, NA, ItalyBrook Bookstore On Demand

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  • Language: English

    Published by Springer New York, 2010

    1441923063 / 9781441923066

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    Seller: moluna, Greven, Germanymoluna

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    Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Scanning Probe Microscopy&nbspprovides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scrat.

  • Language: English

    Published by Springer Nov 2010, 2010

    1441923063 / 9781441923066

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    Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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    Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today's simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the materials properties influence the instrument's operation, and theorists will understand how simulations can be directly compared to experimental data.Key FeaturesServes as a comprehensive source of information for researchers, teachers, and students about the theory underlying the rapidly expanding field of scanning probe microscopyProvides a framework for linking scanning probe theory and simulations with experimental dataWritten in the style of a textbook with step-by-step examples of how theoretical concepts are used to generate state-of-the-art simulations 296 pp. Englisch.

  • Language: English

    Published by Springer, 2010

    1441923063 / 9781441923066

    • Softcover
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    Seller: Majestic Books, Hounslow, United KingdomMajestic Books

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    Condition: New. Print on Demand pp. 296.

  • Language: English

    Published by Springer, 2010

    1441923063 / 9781441923066

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    Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios

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    Condition: New. PRINT ON DEMAND pp. 296.

  • Language: English

    Published by Springer, Springer Nov 2010, 2010

    1441923063 / 9781441923066

    • Softcover
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    Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000

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    Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The Physics of Scanning Probe Microscopes.- SPM: The Instrument.- Theory of Forces.- Electron Transport Theory.- Transport in the Low Conductance Regime.- Bringing Theory to Experiment in SFM.- Topographic images.- Single-Molecule Chemistry.- Current and Force Spectroscopy.- Outlook.Libri GmbH, Europaallee 1, 36244 Bad Hersfeld 296 pp. Englisch.