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9781441923066 - Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents by Foster, Adam; Hofer, Werner a (11 results)
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Condition: New. pp. 296.
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Taschenbuch. Condition: Neu. Scanning Probe Microscopy | Atomic Scale Engineering by Forces and Currents | Adam Foster (u. a.) | Taschenbuch | xiv | Englisch | 2010 | Springer | EAN 9781441923066 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today's simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the materials properties influence the instrument's operation, and theorists will understand how simulations can be directly compared to experimental data.Key FeaturesServes as a comprehensive source of information for researchers, teachers, and students about the theory underlying the rapidly expanding field of scanning probe microscopyProvides a framework for linking scanning probe theory and simulations with experimental dataWritten in the style of a textbook with step-by-step examples of how theoretical concepts are used to generate state-of-the-art simulations.
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US$ 268.52
US$ 16.74 shipping
Ships from United Kingdom to U.S.A.Quantity: 2 available
Add to basketPaperback. Condition: Brand New. 281 pages. 9.00x6.00x0.70 inches. In Stock.
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US$ 264.81
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Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketPaperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Condition: new. Questo è un articolo print on demand.
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Scanning Probe Microscopy
Language: English
Published by Springer New York Nov 2010, 2010
ISBN 10: 1441923063 ISBN 13: 9781441923066
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Scanning Probe Microscopyprovides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today's simulation techniques and gives examples of theoretical conceptsthrough state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today's research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data. 296 pp. Englisch.
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US$ 163.55
US$ 57.13 shipping
Ships from Germany to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scrat.
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US$ 233.52
US$ 8.70 shipping
Ships from United Kingdom to U.S.A.Quantity: 4 available
Add to basketCondition: New. Print on Demand pp. 296.
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Condition: New. PRINT ON DEMAND pp. 296.
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Scanning Probe Microscopy
Language: English
Published by Springer, Springer Nov 2010, 2010
ISBN 10: 1441923063 ISBN 13: 9781441923066
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The Physics of Scanning Probe Microscopes.- SPM: The Instrument.- Theory of Forces.- Electron Transport Theory.- Transport in the Low Conductance Regime.- Bringing Theory to Experiment in SFM.- Topographic images.- Single-Molecule Chemistry.- Current and Force Spectroscopy.- Outlook.Libri GmbH, Europaallee 1, 36244 Bad Hersfeld 296 pp. Englisch.
