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Condition: New. pp. xviii + 555.
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Seller: Ria Christie Collections, Uxbridge, United Kingdom
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Language: English
Published by Springer New York, Springer New York, 2010
ISBN 10: 144196567X ISBN 13: 9781441965677
Seller: AHA-BUCH GmbH, Einbeck, Germany
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport andmagnetic, optical, and electromechanical properties.By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this bookprovides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.
Seller: Revaluation Books, Exeter, United Kingdom
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Add to basketGebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Serves the rapidly developing field of nanoscale characterization of functional materials propertiesCovers electrical, electromechanical, magnetic, and chemical properties of diverse materials including complex oxides, biopolymers, and semiconductorsFocuses.
Language: English
Published by Springer New York Dez 2010, 2010
ISBN 10: 144196567X ISBN 13: 9781441965677
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport andmagnetic, optical, and electromechanical properties.By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this bookprovides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology. 576 pp. Englisch.
Language: English
Published by Springer New York, Springer New York Dez 2010, 2010
ISBN 10: 144196567X ISBN 13: 9781441965677
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 576 pp. Englisch.